OMNIVISION has introduced two new global shutter CMOS image sensors aimed at the next generation of industrial machine vision, factory automation, intelligent transportation and robotics applications.
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An inspection plan inherited from revision A needs a clear starting point when revision B arrives. Fix the exact model pair, establish the controlling requirements, and document the responsible engineer’s decision before carrying the plan forward.
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As metal additive manufacturing moves deeper into production environments, the industry’s quality challenge is changing. Manufacturers are no longer asking simply whether in-situ monitoring can capture process data. They are asking whether that data can help accelerate qualification, reduce inspection burden, and support more confident production decisions.
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Manufacturers are being asked to produce more parts, to tighter specifications and with fewer skilled people. At the same time, the cost of a manufacturing error is increasing as components become more complex, machines become more expensive and production schedules become less tolerant of delays.
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The response taking shape across the industry is a shift from “inspect to ship” to “measure to improve.” The measurement itself was never the problem – it is what happens to the data behind it afterwards that needs to change. That reframing has picked up a name: virtual metrology.
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As manufacturers look to automate inspection of increasingly complex, high-value components, Kitov.ai has introduced Kitov Prime, a robotic inspection system designed to automate the visual detection and analysis of surface defects.
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Math2Market GmbH has launched GeoDict Quantify, a focused software package for processing and quantitatively analyzing micro-CT, FIB-SEM, and other high-resolution 3D imaging data.
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Nikon Corporation has expanded its robot vision system with a new 3D vision tracking capability designed to enable robots to respond rapidly to workpieces moving through production lines in changing positions and orientations.
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Ajile Light Industries is positioning its DepthScan 3D Inspection Platform as a flexible approach to moving dimensional inspection beyond the metrology laboratory and closer to the production line. Built around the company’s DepthScan structured-light 3D imager, the platform can be configured for laboratory, beside-line or inline inspection, including automated 100% inspection applications.
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With the confocal chromatic line sensor confocalLINE CLI8500, Micro-Epsilon opens a new chapter in 3D metrology: maximum precision, exceptionally high point density, and impressive dynamics in a compact system.
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