Shining 3D has launched EINSTAR, an affordable handheld 3D scanner, making high-quality 3D data available to everyone. The standard EINSTAR package is equipped with Exstar software, and a lightweight carrying
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Renishaw will showcase its RUP1 ultrasonic sensor and RVP vision probe for its REVO 5-axis multi-sensor CMM measurement system at IMTS (booth 135509). From September 12th to 17th at McCormick
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Underscoring its commitment to print quality, Epson America has announced the Epson SD-10, the first Epson-built spectrophotometer. Designed to give SureColor wide-format customers a tool to accurately measure color, the SD-10 is
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Mech-Mind Robotics recently announced the official release of Mech-Eye UHP-140, its all-new industrial 3D camera with micron-level accuracy. Mech-Eye UHP-140 is specially designed for demanding inspection and measurement applications in automotive and other
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Walter Ewag has launched the Walter 3D laser sensor enabling the Walter Helicheck Pro and Plus tool measurement machines to scan with four times the resolution than previously possible and
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To ensure consistent quality is achieved when manufacturing many different devices or components, the results of the production process need to be checked regularly by taking measurements. These checks are
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In car body manufacturing, it is far more difficult to process aluminum blanks than their steel counterparts. One key parameter determining the quality of metal forming is the thickness of
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Highly precise and reliable part inspection is crucial for product quality and reliability in the industrial and manufacturing sector. In the course, if digitalization, metrology 3D scanning technology has proven
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Precision sensor manufacturer Micro-Epsilon has extended its surfaceCONTROL range of high precision 3D snapshot measurement sensors for automated, inline measurement of geometry, shape and surface quality of objects. The surfaceCONTROL
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Park Systems, manufacturer of Atomic Force Microscopes, has announced the launch of Park NX-Hybrid WLI, the first fully integrated system that combines Atomic Force Microscope (AFM) with White Light Interferometer (WLI)
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