Ansys has announced it will release its first metal stamping simulation software in January, an all-inclusive product equipped to meet industry needs within one platform. With Ansys LS-DYNA as its solver, Ansys
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With a 20+ year heritage in industrial measurement starting with the saving production data on in-process and post-process measurement applications, and expanded to machine-tool applications and testing data, Marposs has
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Teledyne FLIR, part of Teledyne Technologies Incorporated has announced the release of the latest versions of FLIR Research Studio software. This new release includes both a Professional Edition with FLIR
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Quality increases customer satisfaction. Today, 3D metrology enables numerous manufacturing companies to monitor and optimize their quality processes. GOM, a company of the ZEISS Group, offers an all-in solution for
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Virtek recently released its Iris ActiveTrack laser positioning software that continuously projects stable, accurate laser lines onto moving parts to guide workers in a variety of manufacturing processes. Even complex, 3D
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High QA has announced a new strategic partnership with Production Expediting Technologies LLC (PRODx), the manufacturing technology startup founded in 2020 to serve OEM buyers’ ultra-urgent needs for production volumes
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Optimal Industrial Technologies, a leader in Process Analytical Technology (PAT), has released version 5.5 of synTQ, its total quality management solution. The software offers advanced functions for data transparency and
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When inspecting welded automotive parts, it would often be beneficial to measure the part both in the free state and forced into a mechanical clamp that simulates the part position
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Hexagon has demonstrated how innovation can be accelerated by opening up the possibility of completing complex CFD (computational fluid dynamics) simulations that were previously too time consuming and expensive using
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Digital Surf has announced the release of Mountains 9, a major new version of the company’s leading software platform for image and surface analysis in microscopy and metrology. With version
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