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ZEISS Launch Microscope and CMM Combined Single Solution

The new ZEISS O-INSPECT duo offers two technologies in one machine allowing large workpieces such as PCBs, fuel cells or batteries to be both measured and inspected in high resolution in their entirety. The combination of 3D measurement technology and microscopic inspection increases efficiency and saves space in quality laboratories. ZEISS O-INSPECT duo is available in the size 8/6/3.​

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