Subscribe Button 1
SUBSCRIBE

Optical

ZEISS Gemini 4 Electron Optics offer Superior Resolution and Signal-to-Noise Ratio

ZEISS has unveiled the new ZEISS Crossbeam 750 focused ion beam-scanning electron microscope (FIB-SEM) that is optimized for demanding sample preparation. It provides a live, high-resolution “see while you mill” view at any imaging and milling condition to enable immediate feedback and eliminate milling interruptions for uniform first-pass transmission electron microscopy (TEM) lamellae and precise FIB cross sections.  

Read Article →

First Quantum Diamond Microscopy System Lands in US for Advanced Chip Failure Analysis

QuantumDiamonds GmbH, the developer of quantum sensing based semiconductor inspection systems, has announced the successful installation of its QD m.1 system at Eurofins EAG Laboratories in Sunnyvale, California. The deployment marks the first North American installation of a commercial quantum diamond microscopy (QDM) system and extends non-destructive magnetic current imaging to failure analysis laboratories serving the US semiconductor market.

Read Article →