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Mahr Acquires Optical Surface Metrology Company OptoSurf

Mahr has announced that it has acquired the German company OptoSurf GmbH. Mahr expands its portfolio in the field of optical surface metrology and opens to its customers the unique potential for assessing tribological properties. The ability to measure surfaces extremely accurately and efficiently enables friction to be minimized, wear to be reduced and the efficiency of systems to be substantially improved.

Scattered Light Technology Advantages

The unique and independent technology of scattered light offers great advantages, especially for finely machined surfaces with high functional requirements. Roughness down to the nanometer range can be detected. The surface parameters are not obtained from a height profile as with conventional tactile or optical methods, but from the distribution of the micro-profile angles within the measuring spots. The rougher the surface, the greater the angle distribution and the wider the scattering of the reflected light. This angular information is closely related to the friction behavior of surfaces in tribological systems.

Wide Range of Applicable Applications

The scattered light technology is characterized by high vibration and distance insensitivity, which qualifies it for direct use in the production environment. It also measures at high speed, making it possible to measure up to 100 percent of the surfaces to be evaluated. Due to the high accuracy of the sensor system, the technology is ideal for finely machined surfaces with high functional requirements, particularly for applications in electromobility, mechanical engineering, aerospace technology, medical technology and semiconductor technology.

New technology for more measurement options

Manuel Hüsken, CEO of the Carl Mahr Group, comments: “For Mahr, scattered light technology is an ideal addition to our existing systems. Our customers will benefit greatly from this, as they will gain higher productivity and even more functionalities and application possibilities in surface analysis.”

For more information: www.metrology.mahr.com

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