Subscribe Button 1
SUBSCRIBE

Machine Vision Brings Sight and Insight to Industry 5.0 Strategies

The next phase of the ongoing development of the industrial sector is being referred to as Industry 5.0, or 5IR for short. Rather than launching a revolution, 5IR seeks to expand on the foundation established by its predecessor, Industry 4.0, which forever disrupted the industrial landscape by introducing big data, automation, cloud computing, artificial intelligence, M2M and the Internet of Things (IoT).

Read Article →

Simplify Integration and Control of Multiple Machine Vision Devices

Artificial Intelligence, edge computing, and Industry 5.0 are machine vision trends that necessitate high-density computer controlled I/O signals for devices ranging from strobes and solenoids, to actuators and photo detectors. Purchasing an I/O card has been the solution up until recently, but this step necessitates additional expenses, software, system complexity, and the use of a host PC slot.

Read Article →

LYNX2 Elevates Automated Visual Inspection For Large Assembly Manufacturing

Accurex Measurement, a leading precision measurement and inspection solutions provider in USA, has announces the launch of the LYNX2 visual inspection system. LYNX2, named after its advanced capabilities and feline-like precision, is designed to transform the landscape of automated machine vision inspection to manufacture aerostructures and other large assemblies.

Read Article →

OMNIVISION Unveils New Global Shutter Sensors for Machine Vision Applications

OMNIVISION, a leading global developer of semiconductor solutions, including advanced digital imaging, analog, and touch & display technology, has announced two new CMOS global shutter (GS) image sensors for machine vision applications. OMNIVISION has created a new Machine Vision Unit, which will focus on creating innovative solutions for industrial automation, robotics, logistics barcode scanners and intelligent transportation systems

Read Article →

Line-Scan Cameras Improve Manufacturing Yield and Quality

Automated optical inspection (AOI) of wafer-based solar cells requires a combination of 2D and 3D imaging to detect imperfections in coatings and printings, and for the reliable characterization of small surface defects. AOI guarantees the highest yield for manufacturers by reducing inspection times and boosting throughput, while also ensuring maximum utilization of raw materials and resources.

Read Article →