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Line-Scan Cameras Improve Manufacturing Yield and Quality

Automated optical inspection (AOI) of wafer-based solar cells requires a combination of 2D and 3D imaging to detect imperfections in coatings and printings, and for the reliable characterization of small surface defects. AOI guarantees the highest yield for manufacturers by reducing inspection times and boosting throughput, while also ensuring maximum utilization of raw materials and resources.

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Online Platform For Selecting Optimal Machine Vision Components For Imaging Systems Announced

Teledyne FLIR IIS has announced SightBase – an advanced Software-as-a-Service (SaaS) platform that accelerates the design-in cycles for imaging systems and reduces customer spending. The new platform includes a virtual lab that increases user confidence when selecting a system configuration to meet their vision application requirements.

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