MVTec Software GmbH and ZEISS have announced a strategic collaboration. As part of this partnership, ZEISS is integrating the machine vision software MVTec HALCON as the foundation for image processing in ZEISS Blockwise, the new software platform for automated microscopy.
Read Article →
Inspectis AB has announced the launch of a new Large-Aperture Ring Light, HD-124-LA, developed for use with Inspectis’ digital microscopes.
Read Article →
INSPECTIS AB has announced the release of its new HD-124-WUV Dual White & UV Ring Light, a high-performance illumination solution designed to enhance inspection capabilities when used with INSPECTIS digital microscopes.
Read Article →
Nikon Corporation has launched new ECLIPSE microscope models, the LV150NA LED, LV150N LED, and MA200 LED, to strengthen the company’s comprehensive range of industrial microscopy solutions.
Read Article →
INSPECTIS AB has announced the launch of a new generation digital microscope, the F40/F40s Full HD Digital Microscope with upgraded image sensing and a new motorized 40:1 Zoom lens. This new system delivers configurable, high-resolution optical inspection powered by INSPECTIS Pro Utility and Metrology Software for image capture, measurement, analysis and reporting.
Read Article →
Image-sensor innovator Singular Photonics has announced a major milestone in its strategic collaboration with Renishaw, a global leader in metrology and analytical instrumentation. The companies have been co-developing next-generation spectroscopy capabilities powered by Singular’s new suite of single-photon avalanche diode (SPAD) image sensors.
Read Article →
Surfmera has announces its advanced suite of atomic force microscopes (AFM), positioning the company as a leader in nanoscale imaging and measurement solutions. Designed to empower researchers and industries, these cutting-edge instruments unlock new dimensions in material properties, chemical composition, and physical phenomena at the atomic and molecular levels.
Read Article →
Nikon Corporation has announced the new ‘Digital Sight 100’ digital camera for microscopes. The Digital Sight 100 can be used in combination with full line-up of industrial microscopes and measuring microscopes.
Read Article →
Thermo Fisher Scientific has introduced the Helios MX1 Plasma Focused Ion Beam (PFIB) Scanning Electron Microscope (SEM). This system enables chip manufacturers to visualize and analyze buried semiconductor structures directly within fabrication (fab) environments.
Read Article →
Semplor, a leading provider of innovative tabletop Scanning Electron Microscope (SEM) solutions, and Digital Surf, renowned for its advanced surface imaging and analysis software, have announced the introduction of the Semplor Explore Apps.
Read Article →