Earlier this year, Bruker Alicona, a leading manufacturer of optical metrology solutions, introduced the FocusX—a groundbreaking device that has transformed quality assurance. What sets it apart is its Advanced Focus-Variation technology, which enables precise measurement of micro-geometries and surface roughness on smooth and even reflective surfaces using a single sensor.
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ZEISS has announced its new ZEISS Crossbeam 550 Samplefab, a focused ion beam scanning electron microscope (FIB-SEM) optimized for fully automated preparation of transmission electron microscopy (TEM) samples.
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Mahr has announced the release of its new MarVision MM 500 measuring microscope for the workshop and laboratory available in two versions, each with three measuring ranges: with manual axes or with CNC axis control. This means that a total of six models are available, from which users can choose the perfect solution for their requirements.
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Nearfield Instruments has launched Lightning Mode, a new feature for QUADRA, the semiconductor industry’s highest-throughput, in-line atomic force microscopy (AFM) metrology system for advanced semiconductor devices.
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Aven, a full-service technology provider, has introduced the new Cyclops 4K Ultra HD Digital Microscope. This breakthrough instrument increases accuracy and productivity while easing eye strain and user fatigue – valuable benefits in high-volume applications, such as parts inspection in assembly operations.
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ICSPI, a leader in benchtop nanoscale imaging instruments, has announced the launch of its new Redux AFM, an automated atomic force microscope (AFM) designed to allow scientists and engineers to effortlessly collect 3-dimensional data at the nanoscale.
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INSPECTIS has announced that its popular BGA inspection systems can now be supplied with optional new XM lenses that offer up to 285x screen magnification, compared to the original standard lens with 200x.
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With the available µManager adapter Allied Vision cameras can easily be configured and used to acquire high-quality images for microscopy tasks, such as live preview and real-time control, time-lapse imaging, multi-channel imaging, or z-stacking.
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Designed for a variety of challenging life science and industrial applications, the DP75 camera empowers researchers and inspectors to capture high-resolution images from brightfield to fluorescence, even in the near-infrared (NIR) range.
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Evident has released updated software for the LEXT OLS5100 laser scanning microscope. Designed for today’s materials science and inspection professionals, the enhanced platform delivers exceptional accuracy and simplicity.
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