‘METROLOGY BREW’ News Bulletin – 7th September
Summary of metrology and smart manufacturing news from the past 7 days.
Nion Brings High-Resolution 3D Vision to Automation
IDS Imaging Development Systems is expanding its 3D portfolio with Nion, an industrial ToF camera featuring 1.2-megapixel resolution and integrated depth processing. It provides high-resolution and temporally stable depth information at 30 fps, even during rapid movements and in changing lighting conditions making it suitable for applications such as automation, robotics and logistics … read more
3D Inspection Data Transformed into Practical Insights
Established in 1995, Quality Manufacturing Corp. is a fabricator offering services from prototype conception to large-scale OEM production. Quality and inspection specialists on the production floor apply Advanced Product Quality Planning (APQP) for new parts, which includes evaluating manufacturing capabilities, identifying and managing potential risks … read more
From Computer Vision to Physical AI – The Next Frontier for 3D Metrology
As industrial automation and 3D measurement move towards increasingly sophisticated spatial awareness, a new generation of artificial intelligence is beginning to change how machines perceive and interact with the physical world. One company pursuing this direction is Perceptron, an AI startup founded in November 2024 by two former Meta research scientists … read more
Hexagon Launches METRICAL for Fully Autonomous CMM Inspection
Hexagon has announced the launch of METRICAL, an automated queuing, loading, and unloading system designed to enable autonomous inspection of parts of all sizes on CMMs. The solution addresses one of manufacturing’s most pressing challenges: the global shortage of skilled inspection labour and the need to increase output without adding operators … read more
Why Surface Roughness Specifications Are Shifting from Ra to Sa
Surface roughness directly impacts sealing performance, friction, wear, coating adhesion, fatigue life, and overall product quality. Yet many manufacturing specifications still rely on Ra, a parameter developed nearly a century ago from a single 2D measurement trace. As modern surfaces become increasingly engineered and complex, manufacturers are discovering … read more
SHINING 3D Introduces Wireless 3D Scanning and Tracking System
SHINING 3D has introduced EinScan Trak, a 3D scanning and optical tracking system that combines large-area scanning with a detachable handheld laser scanner. The system is designed to allow users to capture medium and large-sized objects using optical tracking, while also providing a handheld configuration for smaller components and difficult-to-access features … read more
Optical CMM Targets Toughest Precision Measurement Challenges
Making a precision part is difficult. Proving it meets specification is often harder. Manufacturers continue to push the limits of what can be produced. Smaller features. Tighter tolerances. More complex geometries. Yet measurement technology often remains the bottleneck between production and release. Bruker Alicona will present a new answer to that challenge … read more
CMM Transforms Quality and Raises Productivity 30 Percent
A manufacturer of specialised equipment for microbiology, cell culture and laboratory automation, Don Whitley Scientific (DWS) is also a contract supplier of testing and research services to the medical sector. The company decided it needed to strengthen its quality control (QC) procedures to support growing demand for higher-tolerance components in its products … read more
Dragonfly 3D World 2027 Adds AI Segmentation and Advanced CT Measurement Tools
CT is increasingly being used to inspect complex automotive components, including lightweight structures, castings and battery systems. As component geometries become more complicated, CT analysis must provide more than internal visualization, with engineers requiring quantitative tools to identify defects, measure features and document results … read more
QuantumDiamonds Brings Contactless Current Imaging Closer to Inline Inspection
QuantumDiamonds GmbH (QD) has demonstrated a novel method for imaging electrical current inside a semiconductor structure without making physical contact with it. The technique removes the constraint that has kept quantum-sensing based current imaging inside the failure analysis lab and marks the foundational step on QD’s path toward inline inspection … read more
Angstrom-Level Piezo Stage for AFM, Metrology, and Advanced Imaging
PI (Physik Instrumente) offers the P-733 XYZ piezo nanopositioning stage, delivering 0.1 nm (1 Å) positioning resolution for demanding applications in super-resolution microscopy, atomic force microscopy (AFM), surface nanometrology, and advanced imaging. The P-733 combines frictionless flexure guidance with high-accuracy capacitive position feedback … read more
AI, Vision and Robotics Converge at Advanced Vision & AI Conference
The Association for Advancing Automation has announced the speaker lineup and agenda for its Advanced Vision & AI Conference, September 23–24, in Santa Clara, California. Featuring experts from Waymo, NVIDIA, Tesla, Intrinsic, GE Vernova, Intel, FANUC, Cognex, Siemens Digital. The 2 day conference will focus on vision and AI technologies deployment … read more
