Control Expo 2022 Preview #2

With the most important event in the exhibition calendar for Quality Control and Metrology equipment and services suppliers fast approaching we publish the second in a series of preview articles highlighting a few of the many new and innovative solutions that will be showcased at the Control Exhibition May 3 – 6th May in Stuttgart, Germany.

Contactless Measuring Technology Focus

The special focused show area featuring ‘Contactless Measuring Technology’, which will be held at Control 2022 by the Fraunhofer Business division Vision. On 300 sqm in Hall 6, the show area will present a cross-section of innovative technologies, applications and system components from the field of non-contact measuring and testing technology and provide users with initial guidance in selecting the most suitable technology for their own testing tasks. In recent years, the specialized show area has established itself as a marketplace of innovations for both exhibitors and visitors to the exhibition.

Hall 6 For more information:

Optical Metrology Included in New product Focus

At the Control 2022 exhibition, Mitutoyo will be showcasing their newest products to add to their already extensive product line. However, the real showstopper at their booth will be several custom solutions to represent recent innovations in quality control. With the aim of showcasing how Mitutoyo has developed their products in such a way to support quality control specialists in numerous industries, this year’s Mitutoyo presentations at the exhibition is something you won’t want to miss.

Booth 7401 – 7501 Hall 7      For more information: www.mitutoyo.eu

Analysis of Coatings and Bulk Materials

The M1 MISTRAL is a compact tabletop Micro-XRF spectrometer for the analysis of bulk materials and coatings. Designed for fast and cost-efficient operation it provides accurate information on the elemental composition of materials.

The instrument features high spatial resolution and spot sizes down to 100 µm. Arbitrarily shaped samples, like the most intricate pieces of jewelry, can be analyzed without further preparation, and even more important – nondestructively. Samples sizes of up to 100x100x100 mm³ are supported. A video microscope with cross hair-functionality facilitates exact pinpointing of the desired measurement location. The motorized Z-stage allows fast focusing. The optionally available X-Y-Z stage provides even more comfort.

The M1 MISTRAL is equipped with a high brightness micro-focus X-ray tube that ensures excellent excitation of the measurement spot resulting in a high fluorescence yield. With its powerful, yet easy-to-use, XSpect software suite, the instrument delivers accurate quantification results, no matter whether analyzing bulk materials or the most complicated multi-layer structures.

Booth 5402 Hall 5     For more information: www.bruker.com/nano-analytics

High Precision 3D Inspection of Reflecting Surfaces

The reflectCONTROL Sensor performs 3D surface inspections of glossy and shiny surfaces. The precise recognition of anomalies enables compliance with the highest quality requirements. Flatness deviations in the range of a few micrometers are detected reliably. Monitoring can be either robot-based or stationary in the production line.

When high precision 3D measurements on glossy and shiny components are required, the reflectCONTROL Sensor is the ideal choice. In particular, with flat surfaces, the reflectCONTROL technology impresses with its high measuring rates at micrometer accuracies.

This sensor generates a striped pattern which is mirrored by the surface of the measuring object into the sensor camera. Distortions of this striped pattern represent anomalies on the surface, which are evaluated by software.

The reflectCONTROL 3D sensor reliably detects even slightest flatness deviations of less than 1 µm. The sensor is used, for example, for 3D shape detection of wafers in semiconductor production and quality inspection of flat glass, e.g., in smartphone production.

Booth 4317 Hall 4     For more information: www.micro-epsilon.com

New Sixth Generation Pantec CMM Controller Generation

Pantec Metrology introduces EAGLE R6 – the sixth generation of its well-established and successful motion controller solution for a variety of coordinate measuring machines. The separation of complex logic and application dependent interfaces assure highest speed, exceptional machine throughput and accurate measuring results. The EAGLE R6 ensures mechanically and electrically full backward compatibility to all previous generation EAGLE controllers, making an upgrade to new generation easy and simple.

Booth 7304 Hall 7     For more information: www.pantec-metrology.com

RFP Fringe Probe For 5 Axis REVO System

The RFP probe increases the multisensor capability of the Renishaw 5 axis REVO system by adding non-contact structured light inspection to the existing product range, which now offers five interchangeable probe families, each specifically designed to maximize the advantages of 5-axis motion and infinite positioning on a CMM. The RFP probe is designed for inspection of freeform surfaces and complex geometry, rapidly delivering patches of surface data with a high point density.

Booth 4101 Hall 4     For more information: www.renishaw.com

Interactive, Robot-Guided 3D Sensor System for Rapid Inspection of Large and Complex Workpieces

The quality assurance of products is often based on data from optical 2D and 3D sensors. In order to inspect complex shaped workpieces (car body parts, pressed sheets, castings made of metal or plastic), the sensors are mounted in measuring machines or on robot arms, which move them to a set of measuring positions. The complete inspection of the workpieces and the teach-in of the measurement procedures can be very complex and time-consuming, so that a permanent automated control is not economical for specific workpieces. An overall inspection is often not even necessary, since defects on the workpiece only occur locally. The strengths of robot-guided sensor technology do not lie in detecting such potential defect locations in advance. However, humans can make very good decisions about the need for inspection because they immediately recognize whether and where something might be wrong with the workpiece. The efficiency of the measuring processes is thus considerably increased if the human decides directly whether a workpiece needs to be inspected at all and in which region of interest.

The Fraunhofer Institute for Applied Optics and Precision Engineering IOF has developed a gesture-controlled, robot-guided 3D sensor system that combines the respective strengths of humans and robots through a novel human-robot interaction. The system consists of two optical 3D sensors, a 6-axis robotic arm, and a control unit. One of the 3D sensors is the interaction sensor, which recognizes operator gestures and translates them into commands for the second sensor system, the inspection sensor on the robot arm.

The collaborative robot system allows close cooperation between human and robot. The control unit is responsible for the cooperation of all components, as well as to process and output the 3D measurement results to the operator. A pass/fail evaluation of the region of interest is possible directly after the measurement of the inspection sensor.

Booth 6301 Hall 6     For more information: www.iof.fraunhofer.de

Control Expo Preview #1
Control Expo Preview #3
Control Expo Preview #4
Control Expo Preview #5

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