Nano Archives – Metrology and Quality News

ZEISS Crossbeam 550 Sets Standards in 3D Analytics and Sample Preparation with FIB-SEMs

March 17, 2017March 16, 2017 Keith Mills Publishing Editor

Zeiss presents a new generation of focused ion beam scanning electron microscopes (FIB-SEMs) for high-end applications in research and industry. Zeiss Crossbeam 550 features a significant increase in resolution for

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Acquisition Strengthens Bruker’s Position in Nanomechanical Metrology

January 26, 2017March 22, 2019 Keith Mills Publishing Editor

Bruker has announced that it has acquired Hysitron, Inc., a technology leader in the development, manufacture, and sale of nanomechanical test instrumentation. The acquisition adds Hysitron’s innovative nanomechanical testing instruments

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