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Optical Surface Measurement With Confocal Technology

Mahr has relaunched its powerful confocal microscopes from the MarSurf CM explorer product line. With the compact table-top systems, users can measure surfaces in three dimensions without contact, regardless of the material and extremely quickly and precisely. Thanks to their robust design and insensitivity to environmental influences, they are suitable for use in test and inspection laboratories as well as for quality assurance in production environments.

Within a few seconds, the confocal microscopes deliver precise and repeatable 3D measurements of almost all materials, such as metal, glass, ceramics, semiconductors, polymers or organic materials. The areas of application for the optical systems are just as diverse. They are used for roughness measurements in accordance with DIN EN ISO 21920 / 25178, topography measurements such as volume, wear, isotropy or measurements of micro-geometries and layer thicknesses. The devices determine quantitatively traceable 3D characteristic values and are therefore suitable for many sectors such as the automotive industry, mechanical engineering, electronics and semiconductor industry, microsystems technology, optics, medical technology or materials management.

Two Variants To Select From

The MarSurf CM explorer product line offers user-independent and fully automatic measurements with a travel of 100 x 100 mm and thus uncomplicated operation. Depending on their requirements and measurement tasks, customers can choose between the two variants MarSurf CM explorer 100 or MarSurf CM plus explorer 100, both of which have a very high repeatability.

Patented Multi-Pinhole Technology For Ultra-Fast Image Capture

The confocal microscopes guarantee their performance with ultra-fast image acquisition and high measuring point density thanks to the specially developed and patented multi-pinhole technology. This is a particularly low-noise process that ensures high-quality and unfiltered raw data. The devices also offer high resolution with maximum robustness, edge acceptance and dynamics. They are also characterized by extremely low stray light and robust signaling with high light yield. As a result, they achieve height resolutions down to the nanometer range.

For more information: metrology.mahr.com

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