New Software Release Delivers Major Efficiency Gains for Inspection Workflows
In a fast-paced manufacturing environment where every second counts, the latest software update from Metrologic Group is all about reclaiming time and boosting productivity. With a suite of powerful enhancements and new features, the new release promises to streamline inspection processes, improve reporting clarity, and drive smarter, faster decision-making across the board.
Whether working in quality assurance, production engineering, or metrology lab management, these updates offer incremental, but meaningful, time savings that can add up to significant gains over the course of a production cycle.
Clarity and Precision with Enhanced Scan GDT Reporting
Building on the momentum of the previous release, which introduced PMI tendency and state visibility in Scan GDT, users can now incorporate Scan GDT data directly into their reports. This advancement not only improves evaluation transparency but also reinforces clearer communication between suppliers and customers—an essential step in today’s interconnected manufacturing landscape.
The addition of Scan GDT Profiles further elevates clarity by offering five dedicated views: CAD Analysis, Preparation, Evaluation, Predictive Analysis, and Customization. These profiles intelligently filter and highlight only the most relevant data, helping users focus on key insights without unnecessary clutter.
Smarter Digital Twin Functionality
The Digital Twin continues to evolve, with the new release introducing several notable enhancements. Inspection Path Planning now supports fixed-head configurations, while simulation improvements for Renishaw CMM heads boost accuracy and reliability during virtual testing. Additionally, the expanded Machine Library provides a wider selection of CMM models, giving users more flexibility and choice.
Speed, Control, and Optimization in Scanning
Metrologic’s scanning solutions receive a significant upgrade with adjustable speed management. Operators can now fine-tune scanning speeds based on surface complexity—speeding up on simple geometries and slowing down for intricate details. This smart control reduces cycle times and increases overall throughput, making high-volume inspection more efficient than ever.
Expanded Hardware Integration
The release also strengthens integration with leading metrology hardware. Enhancements to the user experience for Kreon measuring arms and 3D scanners provide more intuitive handling, while improved compatibility with Nikon’s APDIS Laser Radar extends scanning versatility for large-scale components.
Inspection Path Planning Gets Smarter
For setups utilizing robots, rotary tables, and line scanners, the enhanced Inspection Path Planning feature now explores all potential rotary table positions. This results in more optimized trajectory planning and reduced inspection cycle times—yet another boost to operational efficiency.
For more information: www.metrologic.group
