Control Expo 2025 Preview #2
With what has traditionally been one of the most important event in the exhibition calendar for quality control and metrology equipment and services suppliers fast approaching, we publish the second in a series of preview articles highlighting a few of the many new and innovative solutions that will be showcased at the Control Exhibition 6th – 9th May in Stuttgart, Germany.
Opt-scope NEX: Ultimate Precision In Surface Measurement
With the new Opt-scope NEX, Accretech sets a milestone in high-precision surface and contour measurement. The 3D white light interferometer microscope combines state-of-the-art measurement technology with intuitive operation and will be presented for the first time at Control 2025. With an exceptional resolution of 0.01 nm, the Opt-scope NEX enables highly precise, non-contact analysis of surface roughness and contours in three dimensions. The integration of focus variation technology significantly expands the range of applications, allowing the measurement of steep, millimeter-high profiles that are difficult to capture with conventional white light interferometry.
Hall 9: Booth 9505 For more information: www.accretech.eu
High-Precision Machine Calibration Plates and Vision Calibration Targets
JD Photo Data will showcase its high-precision machine calibration plates and vision calibration targets. As specialists in calibration targets and optical components, JD Photo Data provide industry-leading solutions designed to enhance the accuracy and performance of metrology systems, machine-vision applications, and automated inspection processes. JD Photo Data will also present vision calibration targets, essential for validating and fine-tuning machine vision systems whether distortion-free fiducials, precise dot arrays, or edge detection patterns, the targets help optimize camera alignment, lens calibration, and image processing accuracy, enabling higher efficiency and improved defect detection.
Hall 9: Booth 9212 For more information: www.jdphotodata.com
New G3F Profile Portable Laser Profilometer
U-Sense returns to Control 2025 with more revolutionary innovations in quality control including new features added to the G3F product family. G3F Profile – Miniaturized, Ergonomic, and Portable Laser Profilometer which in profile mode delivers highly accurate surface profile measurements across its entire working range. G3F Gap & Flush – high-precision gap and flush measurement provides high-precision gap and flush measurements combining IIoT wireless technology with AI capabilities.
Hall 3: Booth 3309-6 For more information: www.u-sense.it
Bowers Group Unveils New Baty Venture Field of View Series
The Baty Venture FV series of field of view inspection machines represents a significant advancement in the Baty product line, providing remarkable measurement speeds on multiple parts simultaneously. Various stage options allow the impressive Field of View measurement functionality to be stitched together over larger areas to accommodate either larger parts, or larger batches of smaller parts. Setting a new standard in Bowers Group’s precision measurement offering, the Baty Venture FV series offers new levels of efficiency and versatility combined with user-friendly software. Equipped with auto part recognition and a powerful 20Mega pixel camera, coupled with telecentric LED profile lighting and split ring LED ring lighting, this new level in vision systems delivers exceptional image quality.
Hall 9: Booth 9106 For more information: www.bowersgroup.co.uk
4th Generation Scanning Electron Microscope
TESCAN VEGA’s 4th generation Scanning Electron Microscope (SEM) with tungsten filament electron source combines SEM imaging and live elemental composition analysis in a single window of TESCAN’s Essence software. This combination significantly simplifies acquisition of data from the sample, making VEGA SEM an efficient analytical solution for routine materials inspection in quality control, failure analysis and research labs. The modular analytical platform which can be optionally equipped with the widest selection of fully integrated detectors (e.g. CL, Water-cooled BSE or RAMAN spectrometer).
Hall 9: Booth 9316 For more information: www.tescan.com
Create Digital Instructions Fast and Easy
Hall 9: Booth 9419 For more information: www.tepcon.de