The DAkkS-accredited laboratory of eumetron GmbH in Aalen, Germany offers DAkkS calibrations traceable to national standards with an extremely high level of accuracy. The experts use special procedures to calibrate plug gauges, setting rings, calibration spheres and hemispheres as well as test specimens and other reference standards or reference workpieces.
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In the semiconductor industry, it is the smallest details that make the difference between success and failure. With its new 3D sensor from the recently developed XCS series, Automation Technology (AT) is launching a product onto the market that is a real game changer, especially for high-performance applications in the electronics industry.
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The Twyn system, a mobile inspection tool, streamlines quality control processes in industries through intuitive tablet usage. With the release of Twyn version 2.2, intricate measurement tasks are now tackled with heightened efficiency and precision, courtesy of its accelerated and user-friendly workflow.
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Aberlink’s CCD Camera option for its cartesian CMM range has been significantly improved with the launch of a fully automated and motorized collimated lightbox. Having a 300 x 300mm X-Y measuring range, the collimated light solution enables intricate turned parts to be measured with outstanding accuracy.
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ISDI, an innovator in X-ray imaging solutions, is delighted to announce that His Majesty King Charles III, has approved the UK Prime Minister’s recommendation that ISDI should receive a King’s Award for Enterprise in the Innovation category this year.
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In the era of Industry 4.0, where data reigns supreme, the concept of ‘smart data’ has emerged as a beacon of efficiency and insight. As manufacturers navigate through a sea of information generated by their operations, the ability to turn raw data into actionable intelligence has become paramount.
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SYLVAC recently unveiled the integration of the Renishaw SP25M tactile 3D scanning probe into its SYLVAC-SCAN S145 optical measurement machine. This upgrade enhances the machine’s capabilities, providing a multi-sensor solution that detects features beyond optical reach. Specifically designed for measuring holes and slots in cylindrical components, the enhanced system is identified as the SYLVAC-SCAN S145 P.
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Active learning is a machine learning paradigm that involves the model actively selecting the most informative data points for training, rather than relying solely on randomly chosen samples, with the goal of achieving higher accuracy with fewer labelled examples. In traditional supervised learning, a model is trained on a fixed dataset with pre-labelled examples. However, labelling data can be expensive and time-consuming.
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For manufacturers in the western hemisphere, the Center for Precision Metrology (CPM) at UNC Charlotte stands alone as the premier academic research center dedicated to delving into the impacts of these micro measurements.
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Zebra Technologies, has announced new solutions to further enable manufacturers to boost visibility, optimize quality and augment the workforce to operate as a connected factory.
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