Rigaku Announces Detector for General-Purpose X-ray Diffractometers

Rigaku Corporation, manufacturer of X-ray analysis and inspection equipment, has launched their new XSPA-400 ER (X-ray Seamless Pixel Array) detector to the global market following a recent successful domestic launch. The XSPA-400ER is a seamless pixel multi-dimensional detector for X-ray diffractometers with high energy resolution suited to battery, steel and ceramic analysis.

Detecting trace crystalline phases using X-ray diffraction (XRD) measurements is difficult due to the increased background when measuring samples containing transition metals. The high energy resolution of the XSPA-400 ER suppresses sample-derived background increases, enabling highly sensitive measurement of samples containing transition metals, such as iron and steel materials and battery materials.

The detector is also compatible with 0-, 1-, and 2-dimensional measurements, making it highly versatile and suited to measuring a wide range of samples, from powders and bulk materials to thin films. Intensity-priority mode or angular resolution-priority mode can be easily selected by changing the detector orientation. The XSPA-400 ER detector is available as an option on the flagship SmartLab XRD as well the SmartLab SE and fully integrates with the SmartLab Studio II software package.

For more information: www.rigaku.com

 

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