Phase3D Releases True Layer In-Situ Thickness Measurement
Phase3D, a Chicago-based company commercializing in-situ monitoring for additive manufacturing (AM), has announced the launch of True Layer Thickness. This toolkit measures the quantity, in microns, of metal powder spread across the build area, certifying uniform distribution for every layer of every build. The innovation sets a new standard in inspection for metal powder bed fusion (PBF), providing a new in-situ monitoring toolkit for production scale AM.
Regulated industry like aerospace, medical, and energy seeks to advance AM to meet critical use applications through in-situ monitoring to reach born certified parts. Phase3D has worked with a prominent aerospace company to develop the True Layer Thickness toolkit, addressing a critical need to ensure high quality part production.
Key Aspects of Phase3D’s True Layer Thickness are:
Objective Data: True Layer Thickness uses patented Fringe in-situ monitoring technology to create quantifiable measurements, in microns, of how much powder is spread during the metal PBF process.
Precision and Consistency: This toolkit ensures precise inspection of the amount of deposited metal powder for every layer of every build.
Industrial Solutions: Tailored to the challenges of industrial manufacturing, True Layer Thickness addresses the requirements for industrial applications beyond aerospace including defense, energy, medical, and more.
Seamless Integration: True Layer Thickness integrates seamlessly with Phase3D’s existing in-situ monitoring system, Fringe, which can be added to most metal AM machines to support product development to production.
The True Layer Thickness toolkit is a big step forward for the AM industry to reach born certified production. Fringe in-situ monitoring and True Layer Thickness provide objective measurement data to inspect every build in real-time.
Dr. Niall O’Dowd, CEO and Founder of Phase3D, expressed enthusiasm about the release, stating, “We are pleased to introduce True Layer Thickness. This new toolkit underscores our commitment to advancing AM for the benefit of widespread adoption of the technology for critical use applications.”
For more information: www.additivemonitoring.com
