LMI Technologies (LMI), the global leader in 3D scanning and inspection, has announced the official release of its Photon Optical Inspection System. The non-contact system provides surface characterization of multi-layered, textured, mixed, and a wide range of other precision-manufactured materials. The system is CE and FCC-certified.
Photon leverages LMI’s Line Confocal and Laser Profiler sensor technology to scan material surfaces with submicron precision, and at a level of quality and speed that outperforms competing technologies.
The system uses high-precision encoders, vibration-free movement, and automated stitching software to scan challenging materials, over large fields of view, in a variety of offline and at-line quality inspection applications, as well as laboratory and R&D processes.
Every Photon Optical Inspection System includes a vacuum table, industrial PC with onboard motion path planning and standard inspection software, joystick, and calibration block. Its surface characterization capabilities include part alignment, automatic feature detection and profile extraction, multi-coordinate measurement, Geometric Dimensioning and Tolerancing (GD&T), surface roughness analysis, and more.
Photon’s maximum XY scanning area is 400mm x 300mm with a maximum sample height (Z) of 300mm with a maximum scanning speed of 30mm per second. Photon is a cost-effective, non-contact alternative to CMM systems that rely on touch-probe data acquisition.
“Photon provides manufacturers with a versatile, high-speed scanning system that can be used in a wide variety of offline and at-line quality inspection, lab metrology, and R&D applications, where challenging material surfaces need to be characterized and reported on. And, this system comes in at a significantly lower cost than competing technologies such as optical microscopes and CMMs, while still delivering the high-precision measurement results production engineers demand”, said Len Chamberlain, Chief Commercial Officer, LMI Technologies.
Photon can be used to perform surface characterization and reporting of some of the most difficult measurement applications including:
➤ Multi-layered cell phone display glass
➤ Curved-edge cell phone display glass
➤ Glue bead volume & position (transparent/translucent)
➤ Medical seal integrity
➤ PCB-to-chip solder ball/ball grid arrays
➤ Battery weld seam integrity
➤ Non-contact surface roughness on practically any material
For more information: www.lmi3d.com