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Next-Level QC: Leveraging Nanometrology for Unmatched Quality Assurance

Manufacturers can benefit from the latest breakthrough in nanometrology for quality control, regardless of their industry. One research team’s invention revolutionizes current nano-microscope applications — and is the first suitable for commercial and industrial use.

A Breakthrough in Nanometrology for Quality Control

As more manufacturers increasingly rely on nanometrology tools and techniques to ensure their products built at the nanoscale level remain effective, reliable and safe, research and development in the field accelerates. Recently, a team from the Korea Research Institute of Standards and Science (KRISS) has made a breakthrough.

The KRISS research team designed a hybrid nano-microscope that’s able to measure three nanoscale materials (nanomaterials) properties in a single scan. They’re the first to engineer such a machine — previous iterations have only been able to measure up to two properties simultaneously. Notably, while others use lenses, this version interacts with the sample using a functional probe. 

This technology integrates the capabilities of photo-induced forced microscopy, atomic force microscopy and electrostatic force microscopy, meaning it can measure a material’s magnetic, electrical and optical properties simultaneously. Traditional nano-microscopes can only measure a single property at a time, limiting their viability in industries where nano-composite materials — materials with composite properties — are commonplace.

Adding to the weight of the breakthrough, the team is also the first to have engineered a hybrid nano-microscope suitable for commercialization. While other machines have complex manufacturing needs that have limited their commercial viability, KRISS’s invention can be integrated into the structure of existing atomic force microscopes. In other words, it enables straightforward adoption and deployment in numerous manufacturing settings. 

The Implications of This Breakthrough in Nanometrology

Manufacturers leveraging nanometrology for quality control — even if they don’t deal with nanomaterials directly — would benefit from unparalleled quality enhancements. In addition to improving their compliance with industry standards, it enhances their process’s precision and consistency.

While microscopic deformities are undetectable to the naked eye, they can adversely impact product performance and aesthetic value. In the aerospace, chemical and pharmaceutical manufacturing sectors, they may even negatively affect the safety and well-being of clients and consumers. For these reasons, nanometrology remains ideal for quality control.

Naturally, heightened quality assurance standards will increase client satisfaction and loyalty, leading to potential revenue gains. In other words, manufacturers who leverage nanometrology techniques and tools are more likely to gain a competitive advantage. 

The Growing Demand for Nanoscale Quality Control

The implications of breakthroughs in nanometrology technology like the one from the KRISS research team are numerous. In the context of quality control, they stand to optimize process accuracy, increase consistency and improve standardization. While standard technologies already provide unparalleled precision, the latest developments enable large-scale deployment.

As nanotechnology has increased in popularity, a need for more advanced quality control measures has emerged. Research shows its market value exceeded $79 billion in 2023 and is projected to reach $91.18 billion in 2024. This surge necessitates the upscaling of commercial and industrial production. 

Traditional quality control methods won’t be able to scale to meet demand — since even small amounts of materials can hold trillions of nanoparticles, effectively scaling quality assurance processes to ensure manufacturers can supply enough product poses a challenge. For this reason, further development of equipment like the KRISS hybrid nano-microscope is vital.

How Manufacturing Sectors Can Leverage Nanometrology

Few manufacturing facilities turn raw materials into finished products at the same facility, meaning a single quality issue can have a substantial ripple effect throughout production. If manufacturers leverage the latest nanometrology developments, they can scale effectively and standardize their quality assurance processes while gaining a competitive advantage. 


Nanoscale measurements are fundamental to commercial and military aerospace manufacturing. If manufacturers leverage the latest in nanometrology, they stand to gain a competitive or offensive advantage. Additionally, they will have an easier time meeting industry regulations and collecting accurate data for recordkeeping purposes. 

Consumer Electronics

Consumer electronics manufacturers would benefit substantially from advancements in nanometrology for quality control since most of their products rely on components built at the nanoscale. Companies would see performance and reliability improvements, reducing the possibility of device malfunctions. 


Chemical manufacturers leveraging nanometrology can benefit from safety and performance gains when they use the latest technologies and techniques to verify the conductivity, viscosity or density of material properties during quality control testing. This way, they can prevent minor product inconsistencies. 


In pharmaceutical manufacturing, nanoscale bacteria pose a significant issue. If manufacturers don’t adequately scale their quality assurance processes to align with production, they risk unknowingly supplying contaminated medication or medical instruments to clients. 

The Future of Nanometrology Quality Control

Manufacturers — even those that don’t deal directly with nanoscale materials — could benefit significantly from leveraging nanometrology for quality control. While some might consider it excessive, recent breakthroughs suggest that adoption and deployment will become more cost-effective. Eventually, it may even become the multi-industry standard.

Author: Ellie Gabel – Associate Editor @ revolutionized