Next-Generation Nanomechanical Test System Launched
Bruker Corporation has announced the release of the Hysitron TI 990 TriboIndenter, which brings superior levels of performance, automation, and productivity to nanomechanical testing. TI 990 is a comprehensive advancement of Bruker’s industry‑leading TriboIndenter platform with new measurement modes, 2X faster testing throughput, and a larger 200mm x 300mm testing area. These enhancements deliver tangible benefits across a variety of applications and markets, for example, improved accuracy for nanoscale testing of polymer thin films, increased throughput for combinatorial materials science, and multi‑measurement analysis of full 300‑mm semiconductor wafers.
Utilizing multiple patented and proprietary technologies, TI 990 enables quantitative mechanical and tribological characterization at the nanoscale. Every aspect of the measurement and analysis process features updated technology, including the new Performech III controller, advanced feedback control modes, next-generation nanoDMA IV dynamic nanoindentation, and XPM II high-speed mechanical property mapping. Nearly any sample can be mounted using the universal sample chuck and measured with a larger testable area. Top-view sample navigation streamlines system setup in the new TriboScan 12 software, allowing for simplified remote operation of the instrument.
With its combination of performance, usability, and flexibility, TI 990 is an ideal characterization solution for polymer research, alloy development, and semiconductor devices. “Every aspect of TI 990 was reimagined to optimize the testing process and potential,” added Dr. Oden Warren, General Manager of Bruker’s nanomechanical testing business. “Our engineers have made everything better, from increased measurement flexibility to easier system setup and more streamlined operation. I look forward to seeing the breakthroughs our customers are going to make with this new system.”
“Bruker’s latest system includes powerful new tool control, particularly its new mixed-mode feedback control, which opens research possibilities at both extremes of the time domain,” said Prof. Nathan Mara, University of Minnesota Twin Cities. “It’s impressive to see how the boundaries for new experiments at small length scales are being expanded.”
Nanoscratch: Understand tribological characteristics or adhesion properties by combining a normal load with lateral displacement of the probe. In addition to force and displacement data collection, TI 990 can incorporate post-scratch in-situ scanning probe microscopy (SPM) imaging of the sample with nanometer resolution for immediate topographic results.
Nanowear: Conduct tribometer-like experiments at the nanoscale by sliding a scratch probe in a reciprocating motion while monitoring force and displacement both normally and laterally. Two-dimensional capacitive transducer technology enables high-sensitivity friction maps to be acquired as a function of number of cycles, applied normal force, wear depth, and lateral displacement.
In-Situ SPM Imaging: Directly correlate sample topography images with nanomechanical and nanotribological characterization data. The TI 990’s nanometer-precision test placement accuracy ensures image and data are colocalized, enabling both pre- and post-test SPM imaging to avoid surface defects, correlate phases with properties, and analyze deformation behavior.
XPM II: Quickly map mechanical properties while maintaining high measurement resolution and accuracy. The high-bandwidth electrostatically actuated transducer, fast control and data-acquisition electronics, and top-down in-situ SPM imaging combine to produce quantitative nanomechanical property maps and property distribution statistics in record time.
nanoDMA IV with CMX: Conduct nanoscale dynamic mechanical analysis to examine properties as a function of indentation depth, frequency, and time. Bruker’s CMX control algorithms provide a quantitative and truly continuous measurement of mechanical properties, including hardness, storage modulus, loss modulus, complex modulus, and tan delta.
Nanoindentation: Obtain force versus displacement curves to quantitatively characterize the mechanical properties of small volumes of material. The combination of the unique capacitive transducer design, tightly controlled calibration standards, and precisely machined probes produces reliable measurements of reduced modulus, hardness, and more on any material.For more information: www.bruker.com
