Marposs has announced the latest addition to its highly successful line of Industry 4.0 metrology solutions, the STIL Micromeasure 2 3D measuring system.
The Micromeasure 2 high-performance 3D measurement system is ideal for noncontact surface measurement, providing exceptional performance across a wide range of metrology uses, including machined parts, electronics, semiconductor, and wafer processing. Its chromatic confocal sensing technology can measure dimensional attributes, surface roughness, three-dimensional shapes and microtopography, and displacement of part features relative to datums and other features, even in challenging materials like glass and polymers.
Chromatic Confocal Technology
A member of the MIME family of metrology devices, the new system builds on the success of Marposs STIL’s existing chromatic confocal technology. The Micromeasure 2 comes equipped with high-resolution motors in the X, Y, and Z axes, 3D processing software, a computer and programmable motion controller, and three sizes of measurement stage: 100 x 100, 200 x 200, and 300 x 300. It is also compatible with all STIL sensors and controllers, and for more advanced measurements and deeper surface analysis, the STIL Mountains software is available.
The result is a metrology solution even for the most demanding applications. Depending on the STIL sensor used, measuring range can be from 150 μm to as much as 30 mm, providing different scales of analysis and a wide array of surface characterizations.
For more information: www.marposs.com