GBS, a leading company in optical 3D sensors based on coherence scanning (white-light) interferometry, has announced that it now offers complete wafer measurement systems configured for use under clean room conditions.
Read Article →
Aven, a full-service technology provider, has introduced the new Cyclops 4K Ultra HD Digital Microscope. This breakthrough instrument increases accuracy and productivity while easing eye strain and user fatigue – valuable benefits in high-volume applications, such as parts inspection in assembly operations.
Read Article →
The guideline VDI/VDE/VDMA 2632 Part 2 provides instructions for the creation of a requirement specification for industrial image processing systems and thus supports communication between suppliers of image processing systems and users in the project phase.
Read Article →
FLIR, a Teledyne Technologies company, has announced the FLIR A6301, a cooled-core longwave thermal imaging camera designed for 24/7 inspection and automation applications aimed at making production lines more efficient and improving product quality.
Read Article →
OMNIVISION, a leading global developer of semiconductor solutions, including advanced digital imaging, analog, and touch & display technology, has announced two new CMOS global shutter (GS) image sensors for machine vision applications. OMNIVISION has created a new Machine Vision Unit, which will focus on creating innovative solutions for industrial automation, robotics, logistics barcode scanners and intelligent transportation systems
Read Article →
Aberlink’s CCD Camera option for its cartesian CMM range has been significantly improved with the launch of a fully automated and motorized collimated lightbox. Having a 300 x 300mm X-Y measuring range, the collimated light solution enables intricate turned parts to be measured with outstanding accuracy.
Read Article →
SYLVAC recently unveiled the integration of the Renishaw SP25M tactile 3D scanning probe into its SYLVAC-SCAN S145 optical measurement machine. This upgrade enhances the machine’s capabilities, providing a multi-sensor solution that detects features beyond optical reach. Specifically designed for measuring holes and slots in cylindrical components, the enhanced system is identified as the SYLVAC-SCAN S145 P.
Read Article →
General Inspection, LLC recently installed its new VisionLab-300-X, 3D Fastener Gauging System at a large bolt manufacturer in Indiana to streamline their first part inspection process.
Read Article →
The 4D Technology high precision, dynamic interferometer combines short and long coherence capabilities into one system for measuring an expanded range of optics. The AccuFiz Duo’s additional long coherence source uses a stabilized HeNe laser and operates with all the benefits of a standard phase shifting Fizeau interferometer.
Read Article →
Onto Innovation has announced the release of a new sub-surface inspection capability for the Dragonfly G3 sub-micron 2D/3D inspection and metrology platform. The new capability enables whole wafer inspection for critical yield impacting defects that can lead to lost die as well as entire wafers breaking in subsequent process steps.
Read Article →