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Automated Atomic Force Microscope To Make 3D Nanoscale Data More Accessible

ICSPI, a leader in benchtop nanoscale imaging instruments, has announced the launch of its new Redux AFM, an automated atomic force microscope (AFM) designed to allow scientists and engineers to effortlessly collect 3-dimensional data at the nanoscale.

ICSPI’s mission is to expand access to nanoscale measurement with powerful, automated and intuitive imaging tools. Building on the success of its nGauge AFM, of which hundreds of units are in operation in over 30 countries, ICSPI is excited to introduce the Redux AFM and elevate the user experience of nanoscale imaging with automation.

Traditional AFM instruments, while powerful for nanoscale surface imaging, are often hindered by complex and time-consuming setup processes which are rooted in technology developed in the 1980s. Recognizing this challenge, ICSPI revolutionized the landscape with its unique AFM-on-a-chip technology. The Redux AFM, harnessing this breakthrough technology, makes nanoscale imaging effortless. By integrating multiple components onto a single chip, the Redux eliminates the cumbersome aspects of traditional AFM, such as silicon probe exchange, cantilever alignment, tip crashes, tip-sample approach, and controller tuning.

“Legacy AFMs, with their laser-based sensing, bulky piezoelectric scanners, and finicky silicon probes, are best described as temperamental and often present a daunting and time-consuming experience for users,” said David Morris, Director of Operations at ICSPI. “Our goal with the Redux is to make AFM as fast and as intuitive as optical microscopy, so scientists and engineers can focus on advancing scientific discovery and technological progress.”

The Redux resets the expectations for AFM by offering:

Automated Set-Up: One-click motorized and automatic approach

No laser alignment: One-click configuration

High-Throughput: Three-minute time-to-data for routine scans

Precision Sample Positioning: Motorized XY stage and integrated optical microscope

Large Sample Platform: Sample platform that can accommodate 100-mm wafers

Building on the intuitive design of the nGauge, the Redux introduces even more automation, further refining the user experience. “Unlike many AFM systems, the nGauge’s straightforward design streamlines the learning curve for users. This user-friendly nature not only optimizes resources but also enhances overall productivity by allowing researchers and professionals to focus more on their specific applications and less on the complexities of operating the AFM system,” said Dr. Nas Yousefi, Research Specialist at the nanoFAB, University of Alberta in Edmonton, Canada. “The integrated optical microscope and motorized XY stage on the Redux are great features that prove highly beneficial for users.”

Redux ARM 3D scan of titanium-aluminum alloy

“The nGauge AFM is one of my go-to tools for getting quantitative data at the nanoscale. I’ve been impressed with its versatility and how quickly I can get data. For a lot of the work I am doing, the Redux’s motorized XY movement and integrated optical microscope would be really useful,” said Zachary Tong, the host of material science YouTube channel Breaking Taps, who created one of the most-watched videos about AFM in history. “The Redux is a game-changer for speeding up feedback cycles on experiments.”

ICSPI’s first product, the nGauge AFM, is used by scientists, engineers and educators everyday to collect nanoscale data with speed, precision, and accuracy. Customers of ICSPI’s AFM instruments include leading universities, research institutes, innovative startups and Fortune 500 companies. By simplifying complex processes and dramatically reducing data acquisition times, the Redux AFM opens new possibilities for research and development in numerous fields, ranging from material science to life science. The Redux promises to transform the landscape of nanoscale imaging, making it more accessible, efficient, and productive.

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