Metrology News recently interviewed Dr. Kam Lau, the Founder and CEO of Automated Precision, Inc. (API) and the inventor of the Laser Tracker. Dr. Lau is widely recognized as a global pioneer in advancing dimensional metrology technology, holding numerous patents and earning acclaim for his technological innovations.
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Mileseey Technology has announced the launch of its XRAPE1, a sleek, professional-grade digital laser tape measure that does it all: measures short distances, calculates lengths, aligns surfaces, and records precise angles, all while fitting comfortably into a users hand.
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Ommatidia LiDAR, an innovator in advanced 3D optical metrology and LiDAR systems recently launched its Q2 Laser RADAR.
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A new innovation, EcoAir, has been introduced by Coordinate Measuring Machine (CMM) manufacturer LK Metrology to lower the carbon footprint of its products. The technology is optionally incorporated into new machines or may be retrofitted to CMMs already carrying out measurement and inspection duties in factories, quality control rooms and metrology bureaux.
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WENZEL is stepping up to the challenge by expanding its LH series of small coordinate measuring machines (CMMs). The new sizes—LH 67, 85, 105, and 107—enhance the versatility of WENZEL’s product lineup, offering a broader range of measuring capacities to suit diverse customer needs.
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Artec 3D has launched Artec Studio 19, a professional, all-in-one software solution for 3D scanning, processing, reverse engineering, and quality inspection.
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The LH 1210 CMM supplied is the first machine of its size with the Premium Select accuracy of 1.2 µm + L/450 µm. This makes it the most accurate coordinate measuring machine that WENZEL has ever produced in this size.
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In automated environments, quality control relies on continuous measurement and test data monitoring. Engineers need systems to ensure the precise and secure positioning of test parts, which is essential for achieving reliable and accurate measurement results.
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Peel 3D, backed by Creaform and provider of portable 3D scanners, has announced the release of its Peel.OS 2.0 software. This latest version now fully integrates the Peel.CAD functionalities, making the scan-to-CAD workflow more seamless and efficient than ever.
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Metrology News recently interviewed Marcus Eales, Founder and Director of Aberlink, to explore how the company is reshaping the traditional coordinate measuring machine (CMM) with innovative design, advanced materials, and fresh approach to metrology. This commitment has led to a creative, design-focused range of metrology products that deliver top-tier performance and installed in over 40 countries worldwide.
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