The semiconductor industry is a critical pillar of the modern technology landscape. The components produced are fundamental to the operation of computers, smartphones, automotive systems, and medical devices, and for countless other applications, as electronic devices are used in all modern industries.
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Onto Innovation has introduced the Atlas G6 optical critical dimension (OCD) metrology system, designed to address the growing complexity of process control in advanced semiconductor nodes. As the industry transitions to second generation gate-all-around (GAA) logic and future vertical gate DRAM architectures to support AI applications, manufacturers face tighter structural dimensions, shrinking by up to 30% per generation.
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Zebra Technologies Corporation, a leader in digitising and automating frontline workflows, says it is working closely with its manufacturing customers and industrial automation partners to bridge the gap between logistics and manufacturing industry need for 3D technologies and the upskilling required among industrial automation and machine vision builders and integrators.
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Fractilia, LLC, a leader in stochastics metrology and control solutions for advanced semiconductor manufacturing, has announced the release of Version 5.0 of its product suite featuring the debut of Generation 5 of the company’s patented Fractilia Inverse Linescan Model (FILM) technology.
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Mitutoyo America Corporation has announced the launch of the QM-Fit Smart Vision System, representing a bold step forward in optical metrology. Compact yet powerful, the QM-Fit combines advanced automation, precision imaging, and intuitive operation in an all-in-one package designed to bring high-accuracy dimensional inspection to any desktop.
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Taylor Hobson has unveiled the LUPHOScan 75 HD, an automated system that sets new benchmarks for speed, accuracy, and repeatability in non-contact 3D measurement of small lenses.
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Bowers Group has announced the launch of the Baty Velo FV, the latest addition to its line of non-contact measurement systems. Named after the Latin word ‘veloci’, meaning fast and swift, the Velo FV delivers speed, simplicity, and precision in a lightweight, compact form, making it the perfect entry-level vision system for high-volume, low-cost component manufacturers.
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Nova has announced the release of its latest optical metrology solution, the Nova WMC. This next-generation modular platform has been specifically designed to address the complex requirements of the most advanced packaging applications in semiconductor manufacturing.
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senswork, a leading provider of machine vision and AI solutions for the battery industry, will demonstrate its latest inspection innovations at The Battery Show North America 2025 in Detroit. The company will showcase how its advanced 2D and 3D inline inspection technologies enable manufacturers to ensure 100% quality assurance across battery production lines.
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The art and science of diamond setting for fine jewelry and luxury watches has always required uncompromising precision. Whether crafting melee stones for pavé settings or baguette cuts for elegant watch bezels, every facet and every angle must conform to exact specifications. Even a single micron deviation can compromise both the aesthetics and the value of the stone.
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