Read a quick summary of metrology and smart manufacturing news from the past 7 days. Lumafield Introduces Next-Generation CT Scanning Platform Lumafield has emerged from stealth launching a groundbreaking accessible
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The production of optical components in laser material processing, biotechnology, medical technology as well as semiconductor technology requires highly precise surface measurements including non-destructive quality assurance. According to manufacturer Aerotech,
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The growing amount of electronics within modern vehicles has made the inspection process for wire bonds increasingly challenging, as active devices shrink and bonds are arranged in complex ways. CyberOptics
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FARO has announced the appointment of Jeff Sexton to lead FARO’s global sales organization, effective April 18, 2022. Sexton joined FARO approximately two years ago and has successfully led its
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Covalent Metrology, a provider of analytical services in North America, has announced the installation of two new Thermo Fisher Scientific Helios 5 UC DualBeam focused-ion-beam scanning electron microscopes (FIB-SEMs). Covalent
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Ansys has announced that it has signed a definitive agreement to acquire cloud simulation provider OnScale. Once integrated into Ansys’ existing cloud portfolio, this technology acquisition will help provide a
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Lumafield has emerged from stealth launching a groundbreaking accessible X-ray computed tomography (CT) platform that gives any engineer the ability to look inside their products with unprecedented clarity. Every day,
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TrueGage has announced the release of TrueMap 6, a major new version of the company’s software platform for surface imaging and analysis. With version 6 comes a fully redesigned version
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Mitutoyo America Corporation has announced the release of the RTX Roundtracer Extreme all-in-one measuring system that integrates roundness, contour and surface roughness measurement functions on a single platform to save
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With OptoInspect3D Inline the large 3D data sets generated by optical measuring systems can be compared with optimal reference geometries in a fast and automated way such the validation of
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