Simplifying Precision: Metrologic Advances Inspection with Latest X4 Enhancements
As manufacturing processes become increasingly complex and production demands continue to grow, Metrologic Group remains unwavering in its mission: to make 3D inspection simpler – without compromising on precision. With every new software release, the company brings users closer to that goal, empowering manufacturers to enhance operational efficiency through a universal 3D metrology platform.
The latest release of Metrolog X4 underscores this commitment, introducing a powerful set of features that extend device compatibility, elevate inspection performance, and continue the journey toward fully automated path planning.
Expanded Device Support: Leica ATS800 Now Integrated into X4
X4 users can now take full advantage of the Leica Absolute Tracker ATS800, a leading-edge laser tracker known for its high-precision, long-range capabilities. This integration allows native acquisition using the ATS800’s innovative modes, including Circle, Disc, and Patch, while also enabling inspection strategies already familiar to X4 users.
This move strengthens X4’s position as a truly universal metrology platform, expanding the range of high-performance devices that can be used for demanding inspection applications in aerospace, defense, and energy industries. Whether scanning vast surfaces or inspecting tight tolerances, users benefit from seamless control and consistent results.
CMM Performance: Unlocking New Potential with Pantec Controllers
The Pantec controller, engineered for multi-sensor CMM systems, already offers impressive throughput and measurement reliability. With the latest X4 enhancements, users can expect even greater performance:
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Improved marble stability during head movements ensures smoother operations and better control during scanning and probing.
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Enhanced probe calibration accuracy boosts confidence in each measurement, minimizing the risk of error and improving repeatability across complex inspection tasks.
These updates solidify Pantec’s reputation as a top-tier solution for high-precision CMM applications – and X4’s ability to unlock its full potential.
Automation in Action: Continuous Innovation in Inspection Path Planning
Metrologic’s vision for automated inspection path planning is steadily becoming reality. With Silma X4’s IPP (Inspection Path Planning) technology, users are moving closer to a future where manual path adjustments are no longer necessary. Just define the features to inspect—and let X4 take care of the rest.
The latest release includes two major advancements:
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Improved performance for robotic line scanner operations, streamlining inspection in automated manufacturing cells.
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New support for automatic CMM trajectory generation across multi-patch planes, making it easier to inspect large or complex surfaces efficiently.
These updates represent another meaningful step in automating inspection processes, reducing programming time, and optimizing cycle times—all without sacrificing measurement quality.
One Platform, Many Possibilities
Metrologic continues to demonstrate how a universal metrology platform can adapt to the ever-changing demands of modern manufacturing. With the X4 platform at the center, manufacturers gain a reliable, flexible, and future-ready solution that delivers on the promise of simplified inspection through precision innovation.
For more information: www.metrologic.group
