‘METROLOGY BREW’ News Bulletin – 21st July

Summary of metrology and smart manufacturing news from the past 7 days.

Simulation and Virtual Metrology In Smart Manufacturing

The landscape of manufacturing is undergoing a profound transformation, driven by the principles of Industry 4.0 and the advent of smart factories. In this era of interconnected systems, data-driven decision-making, and autonomous processes, the role of metrology is evolving beyond traditional post-production inspection. Simulation and virtual metrology are emerging as enablers … read more

LK Sensor Adds Surface Roughness Inspection to CMM Workflow

LK Metrology has announced the introduction of a surface roughness sensor. The SURFACER SRP is a plug-and-play probe having a resolution of one micron for seamlessly analysing the surface roughness of a component as part of a CNC measuring cycle on any CMM, provided it has an industry-standard Renishaw probe head eliminating the need for secondary surface roughness inspection … read more

TRUMPF Launch Welding System With Integrated Quality Control

TRUMPF has developed a new system solution that enables users to increase the quality and efficiency of their welding processes. The solution combines several sensors that monitor all process steps during laser welding. An integrated AI quality control system checks the weld seams, for example, and Optical Coherence Tomography monitors the welding depth … read more

450 kV Compact CT System Designed For Dense Parts Launched

RX Solutions, specialist in high‑resolution industrial computed tomography (CT), has expanded its EasyTom L platform line with the EasyTom L 450, the first compact system to combine a 450 kV meso‑focus source (40 µm resolution) with a 150 kV micro‑focus source (5 µm resolution) in a compact platform … read more

LK Metrology Expands into Industrial CT with Acquisition of ProCon X-Ray GmbH

LK Metrology, internationally recognized for its CMMs and more recently its laser scanning sensor technologies, has announced the strategic acquisition of ProCon X-Ray GmbH, a specialist German manufacturer of industrial computed tomography systems. The move marks an expansion of LK Metrology’s capabilities, adding advanced CT to its product suite … read more

Photoneo’s PhoXi Gen3 Sets New Benchmark for 3D Vision in Automated Quality Control

Photoneo, part of Zebra Technologies and a leader in high-resolution 3D vision systems, has announced the launch of its PhoXi 3D Scanner Gen3. Engineered for the most accuracy-critical applications across various industries, the 3D scanner introduces a powerful Blue Laser technology along with its integrated color camera, delivering unparalleled precision and … read more

GelSight Modulus Redefines Mobile Metrology For Tight Spaces With Swappable Precision

GelSight, a pioneer in tactile intelligence technology, has introduced the new GelSight Modulus system to further expand the boundaries of tactile sensing and usher in the next generation of mobile, micron-scale measurement. Modulus brings an entirely new concept to the mobile metrology and Non-Destructive Testing (NDT) space with its swappable … read more

Survey Reveals Misalignment Between Technology Investment and Workforce Readiness

Hexagon’s Manufacturing Intelligence division in the Americas has announced new data that reveals a concerning reality: outdated perceptions of manufacturing, uncertainty, workforce shortages and technology gaps are threatening long-term growth, even as the manufacturing industry continues to modernize. The 2025 America’s State of Manufacturing Report, commissioned by Hexagon and conducted by Dynata … read more

Measurement Software Now Compatible with Renishaw’s Dual-Method Inspection Gauge

Metrologic Group has announced full compatibility between its measurement software suite and Renishaw’s newly launched Equator X-500 system. The integration provides manufacturing and quality teams a powerful new combination: the speed and flexibility of the Equator X-500 alongside the high-performance 3D inspection, data analysis, and digital continuity … read more

FARO Shareholders Overwhelmingly Approve Proposed Merger with AMETEK

FARO Technologies has announced that at the Company’s Special Meeting of Shareholders FARO shareholders approved the previously announced acquisition of the Company by AMETEK, Inc. According to the preliminary results, over 99% of votes cast at the Special Meeting by all shareholders were voted in favor of the merger agreement proposal … read more

Confovis Introduces IR-SIM for Optical Inspection of Bonded Wafer Interfaces

As advanced packaging technologies push the limits of semiconductor manufacturing, the need for non-destructive inspection methods inside bonded wafer stacks becomes more pressing than ever. Confovis now addresses this inspection challenge by introducing IR-SIM, an infrared evolution of its SIM technology, enabling precise, non-invasive analysis … read more

Metron3D Delivers Sub-Nanometre 3D Metrology In-Line

Infinitesima has announced that SK hynix, a full stack artificial intelligence memory provider, has adopted the Metron3D 300mm in-line wafer metrology system and released it for use in volume production. The Metron3D provides three-dimensional process control with sub-nanometre accuracy, crucial for fabrication of SK hynix’s next-generation memory devices … read more

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