With an impressive 1,000 measurements per second, the next-generation sensor is purpose-built for applications such as AGV navigation, robotic control, conveyor systems, and other automation tasks where both speed and precision are critical.
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GelSight has introduced the new GelSight Modulus system to further expand the boundaries of tactile sensing and usher in the next generation of mobile, micron-scale measurement. Modulus brings an entirely new concept to the mobile metrology and Non-Destructive Testing (NDT) space with its swappable lens and camera concept.
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LK Metrology has announced the introduction of a surface roughnesssensor. The SURFACER SRP is a plug-and-play probe having a resolution of one micron for seamlessly analysing the surface roughness of a component as part of a CNC measuring cycle on any CMM, provided it has an industry-standard Renishaw probe head.
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Scanivalve has developed the MPS4264 Miniature Pressure Scanner, a compact, intelligent pressure measurement system engineered to deliver high-accuracy data in real time.
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Due to its physical properties, aluminum plays a major role in the circular economy and achieving climate neutrality. High material quality is crucial during processing, as any contamination present in the aluminum during smelting diminishes the quality of finished components.
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Eddyfi Technologies has announced the commercial release of Cypher, a powerful new portable ultrasonic inspection platform built to deliver faster, clearer, and more confident inspections in the world’s most demanding environments.
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Mitutoyo America Corporation has announced the release of the SurfaceMeasure-S Series. The SM0303S and 2929S sensors join the SM1008S sensor to complete the innovative collection of line-laser sensors engineered for in-line inspection.
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New Imaging Technologies (NIT) has announced the release of its latest SWIR InGaAs line scan sensor, the NSC2301, designed for demanding industrial inspection applications.
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The MarSurf MC 510 measuring device is fully integrated into the tool holder and utilizes a vibration-resistant, non-contact tactile probe system to deliver standard-compliant, high-precision measurements with accuracy down to Rz 1 µm.
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X-Rite Incorporated, a global leader in color science and technology, has announced the launch of the CiF3200 imaging spectrophotometer, designed for color measurement of small, odd-shaped, multi-colored, and highly reflective items.
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