ASH, a leader in digital inspection and measurement technology, has announced the launch of Omni Vantage a next-generation 4K digital microscope setting a new benchmark for precision, speed, and reliability in visual quality control.
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Strada Intelligent Raman Microscope combines the exceptional optical performance and chemical discrimination of research-grade Raman microscopes with an intuitive, user-friendly interface, making advanced chemical analysis accessible to both industrial and multi-user laboratories.
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Inspectis AB, a leading innovator in digital optical inspection systems, has expanded its product lineup with the introduction of the HD-041 360° Rotating Viewer — a new solution engineered to simplify and accelerate visual inspection tasks across manufacturing, electronics, and precision engineering environments.
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Vision Engineering has announced the launch of ProteQ VISO, a 3D digital stereo microscope with a fully integrated ‘autostereo’ display, enabling true flat screen 3D image viewing without traditional eyepieces.
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The semiconductor industry is a critical pillar of the modern technology landscape. The components produced are fundamental to the operation of computers, smartphones, automotive systems, and medical devices, and for countless other applications, as electronic devices are used in all modern industries.
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Onto Innovation has introduced the Atlas G6 optical critical dimension (OCD) metrology system, designed to address the growing complexity of process control in advanced semiconductor nodes. As the industry transitions to second generation gate-all-around (GAA) logic and future vertical gate DRAM architectures to support AI applications, manufacturers face tighter structural dimensions, shrinking by up to 30% per generation.
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Zebra Technologies Corporation, a leader in digitising and automating frontline workflows, says it is working closely with its manufacturing customers and industrial automation partners to bridge the gap between logistics and manufacturing industry need for 3D technologies and the upskilling required among industrial automation and machine vision builders and integrators.
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Fractilia, LLC, a leader in stochastics metrology and control solutions for advanced semiconductor manufacturing, has announced the release of Version 5.0 of its product suite featuring the debut of Generation 5 of the company’s patented Fractilia Inverse Linescan Model (FILM) technology.
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Mitutoyo America Corporation has announced the launch of the QM-Fit Smart Vision System, representing a bold step forward in optical metrology. Compact yet powerful, the QM-Fit combines advanced automation, precision imaging, and intuitive operation in an all-in-one package designed to bring high-accuracy dimensional inspection to any desktop.
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Taylor Hobson has unveiled the LUPHOScan 75 HD, an automated system that sets new benchmarks for speed, accuracy, and repeatability in non-contact 3D measurement of small lenses.
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