Thermo Fisher Scientific has introduced the Helios MX1 Plasma Focused Ion Beam (PFIB) Scanning Electron Microscope (SEM). This system enables chip manufacturers to visualize and analyze buried semiconductor structures directly within fabrication (fab) environments.
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Semplor, a leading provider of innovative tabletop Scanning Electron Microscope (SEM) solutions, and Digital Surf, renowned for its advanced surface imaging and analysis software, have announced the introduction of the Semplor Explore Apps.
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ASH, a leader in digital inspection and measurement technology, has announced the launch of Omni Vantage a next-generation 4K digital microscope setting a new benchmark for precision, speed, and reliability in visual quality control.
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Strada Intelligent Raman Microscope combines the exceptional optical performance and chemical discrimination of research-grade Raman microscopes with an intuitive, user-friendly interface, making advanced chemical analysis accessible to both industrial and multi-user laboratories.
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Inspectis AB, a leading innovator in digital optical inspection systems, has expanded its product lineup with the introduction of the HD-041 360° Rotating Viewer — a new solution engineered to simplify and accelerate visual inspection tasks across manufacturing, electronics, and precision engineering environments.
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Vision Engineering has announced the launch of ProteQ VISO, a 3D digital stereo microscope with a fully integrated ‘autostereo’ display, enabling true flat screen 3D image viewing without traditional eyepieces.
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Fractilia, LLC, a leader in stochastics metrology and control solutions for advanced semiconductor manufacturing, has announced the release of Version 5.0 of its product suite featuring the debut of Generation 5 of the company’s patented Fractilia Inverse Linescan Model (FILM) technology.
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Carl Zeiss Microscopy GmbH has acquired all equity shares of Pi Imaging Technologies SA, located in Lausanne, Switzerland. Pi Imaging Technology SA now operates as ‘Pi Imaging Technology SA – a ZEISS company’ with all employees retained.
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Mitutoyo’s TAG Lens, a revolutionary advancement in optical measurement technology, leverages Tunable Acoustic Gradient-index (TAG) lens technology. The state-of-the-art system delivers high-speed, all-in-focus imaging that reshapes what’s possible in dynamic, microscopic inspection and real-time 3D observation.
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ZEISS has announced that it now offers its highly flexible and efficient software suite ZEN core for all ZEISS scanning electron microscopes (SEMs), including focused ion beam scanning electron microscopes (FIB-SEMs).
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