Subscribe Button 1
SUBSCRIBE

Announcements

Actionable In-Situ Awareness Challenge Winners Announced

The Actionable In-Situ Awareness Challenge was launched to address a persistent gap in metal additive manufacturing, where quality control is still largely post-process and defects are often discovered only after lengthy, costly builds. By creating a competitive, real-world environment, the Challenge provided a pathway for sensor companies to prove their value to end-users across aerospace and defense.

Read Article →

Revolutionizing Defect Detection – Next-Gen e-Beam Inspection Poised for Production

In a move that could reshape semiconductor inspection and metrology, it has been announced that Kioxia Iwate Corporation will begin evaluating a groundbreaking GaN (Gallium Nitride)-based e-Beam inspection and metrology technology in late September. The system has been jointly developed by Nagoya University startup Photo electron Soul Inc. and the Amano-Honda Laboratory at Nagoya University.

Read Article →