New Line Scan Sensor For High-Speed Industrial Inspection
New Imaging Technologies (NIT) has announced the release of its latest SWIR InGaAs line scan sensor, the NSC2301, designed for demanding industrial inspection applications. With advanced features and performance, this new sensor sets a benchmark in SWIR imaging for production environments.
The NSC2301 features a 2048 x 1 resolution with an 8 µm pixel pitch, delivering sharp, detailed line-scan imaging. The size format is best suited to fit standard 1.1’’ optical format optics. This SWIR line-scan sensor supports line rates over 80 kHz, making it ideal for fast-moving inspection tasks. With configurable exposure times and both ITR (Integration Then Read) and IWR (Integration While Read) readout modes, the sensor offers unmatched adaptability for various lighting and motion conditions.
Due to its 3 gains available, the NSC2301 provides the perfect combination of High Sensitivity (read out noise 90e- in High Gain) and High Dynamic Range, crucial for imaging challenging materials or capturing subtle defects in high-speed production lines. The new sensor expands NIT’s proprietary SWIR sensor portfolio.
Typical use cases for the NSC2301 include silicon wafer inspection, solar panel inspection, hot glass quality control, and optical coherence tomography, especially where high-resolution and high-speed line-scan imaging is critical.
For more information: www.new-imaging-technologies.com
