SUBSCRIBE

Skip to content

NEWS
TACTILE
OPTICAL
- OPTICAL – HOME
- VIDEO
PORTABLE
- PORTABLE – HOME
- TRACKERS
ROBOTIC
- ROBOTIC – HOME
- CELL
- NEAR-LINE
- IN-LINE
- GUIDANCE
- HUMANOID
CT
AM
SOFTWARE
SENSORS
S F & G
- S F & G – Home
- SURFACE FINISH
EVENTS
- 2025 EVENTS LISTING
- EVENT NEWS

Enlight optical wafer inspection system

Enlight optical wafer inspection system

← Previous
Next →

Select ‘Metrology News’ Language Edition

2026-media-planner

Newsletter Subscription

Search Metrology News by Category

Search Metrology News by Category

This Months Newsletter Sponsors

News You May Have Missed

Automotive Aftermarket Embracing 3D Reverse Engineering

How AI is Closing the Loop in Industrial Inspection

Intelligent Frontlines Deliver Measurable Improvements in Manufacturing Performance

Beyond the Naked Eye: 3D Scanners Are Forging a New Standard of Precision in the Foundry Industry

Transforming Manufacturing Intelligence – The Case for Total Factory Visibility

Why Metrology Matters in Additive Manufacturing – Closing the Loop Between 3D Printing and Quality Verification

AI in Industrial Metrology: From Deterministic Inspection to Adaptive Intelligence

About Metrology News

Metrology News E-Zine is updated daily providing the very latest in global metrology and quality news from manufacturing industry around the world.

Metrology News showcases new product introductions, technology, innovation, research, people, customer applications, industry trends and sector dynamics.

Make Metrology News Your Daily Read.

Get Featured

Submit Press Release
Submit Metrology News
2026 Editorial Program
Write For Metrology.News

News Archives

News Archives

How To Advertise

2026 Media Planner
2026 Metrology News Advertising Rates
Metrology News Privacy Policy

News Bulletin

Newsletter Sign-Up

Contact Us

Metrology News Publisher
Publishing Editor

editor@metrology.news

www.metrology.news

www.metrologynews.cn

Copyright E-Zine Media 2016 - 2025