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Announcements

AI-Driven Smart Jig Delivers Instant Defect Detection

A research team affiliated with UNIST has unveiled an innovative, high-precision AI-powered quality inspection system that reduces inspection time from 12 minutes to just under 3 seconds. This cutting-edge technology facilitates real-time, micron-scale defect detection during continuous manufacturing processes, paving the way for fully automated, inline quality control in high-speed production environments.

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Actionable In-Situ Awareness Challenge Winners Announced

The Actionable In-Situ Awareness Challenge was launched to address a persistent gap in metal additive manufacturing, where quality control is still largely post-process and defects are often discovered only after lengthy, costly builds. By creating a competitive, real-world environment, the Challenge provided a pathway for sensor companies to prove their value to end-users across aerospace and defense.

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Revolutionizing Defect Detection – Next-Gen e-Beam Inspection Poised for Production

In a move that could reshape semiconductor inspection and metrology, it has been announced that Kioxia Iwate Corporation will begin evaluating a groundbreaking GaN (Gallium Nitride)-based e-Beam inspection and metrology technology in late September. The system has been jointly developed by Nagoya University startup Photo electron Soul Inc. and the Amano-Honda Laboratory at Nagoya University.

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