Since relaunching, LK Metrology and Nikon Metrology have closely collaborated to offer total solutions for non-contact inspection. As such, the Nikon laser scanners and Focus software are a natural extension of LK Metrology’s product offering.
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With the growing demand for precise geospatial data, the partnership has led to the creation of a state-of-the-art 360-degree panoramic camera head designed for automated data collection.
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iGrafx, a leader in process intelligence solutions, has announce the launch of Pia, a cutting-edge Generative AI assistant that transforms how businesses manage and optimize their processes.
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The International Center for Networked, Adaptive Production (ICNAP) comprising of three Fraunhofer Institutes will be presenting an AI-supported analysis system for visual quality control at the SPS trade fair in Nuremberg, Germany. ICNAP will demonstrate how deep learning can be used to check weld seams on battery cell mod-ules for defects in real time.
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The World Economic Forum recently announced that 22 innovative manufacturers have joined the Global Lighthouse Network, expanding the community to 172 leading production facilities and value chains that harness digital technologies at scale to drive next-generation operational excellence, environmental sustainability and workforce development.
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Measurement has always been the bedrock of manufacturing excellence, capturing data to ensure precision, validate quality, and improve processes. But as we turn our gaze to the future, measurement science is no longer just about collecting data; it’s about harnessing that data in innovative ways that actively drive manufacturing processes forward.
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autoVimation, a pioneer in the design and production of industrial-grade protective camera enclosures, has introduced its first protective camera enclosure with an integrated water-cooling circuit.
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ZEISS has announced its new ZEISS Crossbeam 550 Samplefab, a focused ion beam scanning electron microscope (FIB-SEM) optimized for fully automated preparation of transmission electron microscopy (TEM) samples.
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Starrett has expanded its AVR Vision Metrology Line with the introduction of the AVR400 CNC Vision System, the largest benchtop platform to date from Starrett with stage travel that is twice the speed of previous Starrett AVR models.
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ZEISS Industrial Quality Solutions is hosting its first-ever ZEISS Live Tech Reveal on Thursday, February 27, 2025, at 2:00 p.m. ET. Exclusively for the USA and Canada, the digital event will reveal seven new cutting-edge metrology technologies and software updates in less than an hour.
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