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Month: September 2025

Actionable In-Situ Awareness Challenge Winners Announced

The Actionable In-Situ Awareness Challenge was launched to address a persistent gap in metal additive manufacturing, where quality control is still largely post-process and defects are often discovered only after lengthy, costly builds. By creating a competitive, real-world environment, the Challenge provided a pathway for sensor companies to prove their value to end-users across aerospace and defense.

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Renishaw Introduce MODUS IM Equator Intelligent Metrology Software

Renishaw has announced that it will introduce its new MODUS IM Equator software at EMO Hannover 2025. The software is built on the MODUS IM platform, to maximise productivity for Equator and Equator-X gauging system users. MODUS IM Equator software is part of Renishaw’s continuing investment in innovation with a drive to improve both the capability and customer experience of Renishaw metrology systems.

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Revolutionizing Defect Detection – Next-Gen e-Beam Inspection Poised for Production

In a move that could reshape semiconductor inspection and metrology, it has been announced that Kioxia Iwate Corporation will begin evaluating a groundbreaking GaN (Gallium Nitride)-based e-Beam inspection and metrology technology in late September. The system has been jointly developed by Nagoya University startup Photo electron Soul Inc. and the Amano-Honda Laboratory at Nagoya University.

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Augmented Reality -Transforming Quality Control and Driving Superior Product Quality

Quality control is now a highly integrated, data-driven process that spans the entire product lifecycle. Among the technologies driving this evolution, augmented reality (AR) has emerged as a transformative force. By merging digital data with physical environments in real time, AR is reshaping how manufacturers perform inspections, train personnel, and maintain quality processes.

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