Taylor Hobson has unveiled the LUPHOScan 75 HD, an automated system that sets new benchmarks for speed, accuracy, and repeatability in non-contact 3D measurement of small lenses.
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GelSight, the tactile intelligence technology specialist, has released its GelSight Mobile 4.2 (GSM 4.2) software update, introducing advanced automation tools and full support for the company’s newly launched Modulus hardware platform.
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The Actionable In-Situ Awareness Challenge was launched to address a persistent gap in metal additive manufacturing, where quality control is still largely post-process and defects are often discovered only after lengthy, costly builds. By creating a competitive, real-world environment, the Challenge provided a pathway for sensor companies to prove their value to end-users across aerospace and defense.
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Baumer has announced the acquisition of Swiss sensor specialist X-Sensors AG, further strengthening its position in force and strain measurement technology.
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SCANOLOGY (Formerly Scantech) from China has announced the launch of SIMSCAN Gen2, a palm-sized industrial 3D laser scanner designed for fast, precise, and effortless scanning of small to medium-sized parts, even in tight, hard-to-reach spaces combining advanced technology with ergonomic design.
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Renishaw has announced that it will introduce its new MODUS IM Equator software at EMO Hannover 2025. The software is built on the MODUS IM platform, to maximise productivity for Equator and Equator-X gauging system users. MODUS IM Equator software is part of Renishaw’s continuing investment in innovation with a drive to improve both the capability and customer experience of Renishaw metrology systems.
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In a move that could reshape semiconductor inspection and metrology, it has been announced that Kioxia Iwate Corporation will begin evaluating a groundbreaking GaN (Gallium Nitride)-based e-Beam inspection and metrology technology in late September. The system has been jointly developed by Nagoya University startup Photo electron Soul Inc. and the Amano-Honda Laboratory at Nagoya University.
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Bowers Group has announced the launch of the Baty Velo FV, the latest addition to its line of non-contact measurement systems. Named after the Latin word ‘veloci’, meaning fast and swift, the Velo FV delivers speed, simplicity, and precision in a lightweight, compact form, making it the perfect entry-level vision system for high-volume, low-cost component manufacturers.
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Quality control is now a highly integrated, data-driven process that spans the entire product lifecycle. Among the technologies driving this evolution, augmented reality (AR) has emerged as a transformative force. By merging digital data with physical environments in real time, AR is reshaping how manufacturers perform inspections, train personnel, and maintain quality processes.
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Nova has announced the release of its latest optical metrology solution, the Nova WMC. This next-generation modular platform has been specifically designed to address the complex requirements of the most advanced packaging applications in semiconductor manufacturing.
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