Korean digital X-ray detector specialist Rayence has introduced its industrial high-speed CMOS X-ray detector platform, the Flash Series, designed specifically for semiconductor AXI and high-speed 3D X-ray CT inspection systems.
Read Article →
A new generation of robotic inspection systems is emerging to overcome these challenges. At the Advanced Inspection, Methods and Materials (AIMM) Center in Ogden, Utah, Omni NDE has upgraded its robotic computed tomography (CT) platform, demonstrating how robotic scanning, high-resolution detectors and advanced software can expand the possibilities for non-destructive evaluation (NDE) of composite and hybrid structures.
Read Article →
The ability to look inside complex components without cutting them open or dismantling them lies at the heart of nondestructive testing (NDT). However, traditional industrial computed tomography (CT) systems are constrained by the size of the objects they can accommodate. Components must fit inside the scanner, limiting the application of CT for large assemblies such as full vehicles, aircraft structures, or large energy systems.
Read Article →
Royma, a Chinese provider of inline CT systems, industrial CT and X-ray solutions is strengthening its technological position through a strategic collaboration with Excillum, the world leader in extreme-brightness micro- and nanofocus X-ray sources.
Read Article →
Allied Vision has announced that its EoSens 1.1CXP2 high-speed CMOS camera has been selected as the core imaging engine in ‘Hayaka,’ a lens-coupled high-speed X-ray system developed by a team from Tohoku University and Nishikyushu University, Japan.
Read Article →
LK Metrology has introduced its innovative COREX 250 from Ready Metrology, the holding group’s brand that develops easy-to-use X-ray CT as well as CMM solutions for shop floor applications.
Read Article →
From additive manufacturing to aerospace castings, CT provides engineers with the ability to visualize and measure internal structures that would otherwise remain hidden. Now, artificial intelligence (AI) is transforming CT workflows, automating defect detection, improving accuracy, and accelerating throughput.
Read Article →
Rigaku Corporation, a solution partner in X-ray analytical systems has announced the launch of the ONYX 3200, a new semiconductor metrology system to measure film thickness, composition and bump structures for wafer-level processes.
Read Article →
In the rapidly maturing pickleball market, the gap between good and great has narrowed to just a few percentage points. For elite paddles, performance differences between top brands can be as small as five percent—nearly indistinguishable without precise measurement. At this level of refinement, incremental improvements are no longer enough
Read Article →
Nikon Corporation has announced a comprehensive suite of enhancements to its XT V Series X-ray and CT systems, strengthening the platform’s position as a world-class solution for non-destructive inspection of electronic components.
Read Article →