Line-Scan Cameras Improve Manufacturing Yield and Quality
Automated optical inspection (AOI) of wafer-based solar cells requires a combination of 2D and 3D imaging to detect imperfections in coatings and printings, and for the reliable characterization of small surface defects. AOI guarantees the highest yield for manufacturers by reducing inspection times and boosting throughput, while also ensuring maximum utilization of raw materials and resources.
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