If the sample can’t go to the instrument, the instrument must come to the sample! The Fischer FISCHERSCOPE X-RAY XAN 500 offers a mobile X-ray fluorescence (XRF) device optimized for coating thickness measurement and material analysis of alloys.
Despite its small size, the XAN500 is the equal of any XRF instrument typically found in a lab. Its modern silicon drift detector (SDD) guarantees correct measurement results in just a few seconds. And even complex measuring tasks involving multiple layers and various alloys are resolved reliably.
Especially when measuring coating thicknesses, it is of great importance to ensure that the distance between device and sample remains constant and the beam path is straight. The XAN500’s 3-point support allows users to set the device up safely and stably, for accurate measurement of coatings. Result is shown directly on the device’s display and for further data evaluation, the XAN500 is equipped with the full WinFTM software suite.
Coating thickness measurement and material analysis with WinFTM are both based on fundamental parameter analysis making it possible to measure accurately without prior calibration. For the occasions when the highest degree of precision is required DAkkS-certified standards are available that allow device calibration for specific measuring task quickly and easily.
The XAN500 can also be robot mounted allowing integration directly into an automated production system for 100% part inspection. Wireless operation always seamless integration into process control systems.
For more information: www.helmut-fischer.de