New Concepts for Future Measurement Technology

On Wednesday, 8th of May at the Control Exhibition in Stuttgart, Germany, an expert panel will hold a discussion ‘New concepts for the measurement technology of the future’. The event will take place at 12:30 pm at the Control Vision Talks Forum (Hall 6, Booth 6515).

Participants from Faro (Denis Wohlfeld), Isra Vision (Holger Wirth), Werth Messtechnik (Dr.-Ing. Ralf Christoph) and Zeiss (Dr. Kai-Udo Modrich), as well as Roland Beyer, who has been discussing metrology at Daimler for many years and image processing, new technologies and upcoming changes in metrology.

The forum presentations aim to educate visitor on benefits, applications and methods of machine vision and optical metrology solutions for factory automation. The talks will be held in German or English language and will present technology background as well as dedicated solutions going way beyond mere marketing-oriented product presentations. Towards this goal each of the three first days of Control will feature presentations for a dedicated technology topic:

  • 3D Machine Vision  | Tuesday, May 7th
  • Optical Metrology: Offline to Inline  | Wednesday, May 8th
  • CT and X-ray |  Thursday, May 9th
  • Spectral Imaging: From Infrared to Hyperspectral  | Thursday, May 9th

Hall 6   Booth 6515
The detailed program of a total 26 presentations and two panel discussions is available for download.