MetMap – Integrated Metrology for Precision Manufacturing Conference

MetMap Integrated Metrology for Precision Manufacturing is the first of two conferences being held as part of a road mapping project to define the future of integrated metrology in advanced manufacturing in the UK.

22 – 23 January 2019, Knowledge Transfer Centre, Advanced Manufacturing Research Centre, Sheffield, UK

MetMap defines integrated metrology as any measurement that is made in relation to the manufacture of a product. This is divided into the following sub-themes: in-process, off-line, on-machine, in-line and in-situ.

Academic and industrial experts will present and promote key advances in precision manufacturing metrology and establish any additional critical requirements from industrial users and manufacturers. The conference will focus on four key themes of Sensor development, Process monitoring, Process control and Data handling.

A number of keynote speakers will set the scene and review the future, and each session will consist of a state-of-the-art review and regular talks.

Presentations will be invite only, if you feel you can contribute, please contact the organizers. A limited number of exhibitions will be available for companies.

For more information: