Jenoptik has supplied its Waveline W900C high-precision contour measuring system to Český Metrologický Institute (CMI) in Brno, Czech Republic.
Jenoptik has had for many years a strong metrology partnership with CMI, among others for the calibration of metrological reference standards. The CMI already uses two Jenoptik Waveline T8000R systems for the calibration of roughness standards.
Launched by Jenoptik in 2019, the Waveline W900 measuring system, together with the Waveline W800 series, replaces the previous Waveline T series. Depending on the model, it can be used for roughness measurement, contour measurement or as an RC version for both. With an axis speed that is six times faster and a 30 percent improvement in background noise, Waveline W900 features a significantly faster measuring speed and higher measuring accuracy than its predecessors. In addition, its modular design allows for easy extension at any time.
Jiri Borovsky, head of the calibration department at CMI, was visibly enthusiastic about the new W900: “The device is significantly better than its predecessor. It offers a lot more measuring possibilities, it is easier to operate and in the first tests it has already delivered more stable and accurate results than the T8000.”
The CMI is the national metrology standards body in the Czech Republic, and the country’s highest authority for all questions of correct measurement, comparable with the Physikalisch-Technische Bundesanstalt (PTB) in Braunschweig, Germany. The institute is also responsible for the calibration of standards.
For more information: www.jenoptik.com