HD Dynamic Profiler Automates Surface Roughness Measurements

The NanoCam HD surface roughness profiler from 4D Technology utilizes Dynamic Interferometry, with a high-speed optical sensor that measures thousands of times faster than traditional profilers. Because acquisition time is so short, the NanoCam HD can measure despite vibration, making it possible to mount the instrument on a gantry or robot end effector as well as inside of a polishing station to measure polishing quality.

Applications for NanoCam HD optical profilers include surface roughness of small and large coated and uncoated optics, on-machine surface roughness metrology, and process control for polishing operations, including measuring super-polish.

NanoCam HD new autofocus capability allows for faster, more consistent measurements requiring fewer manual adjustments when measuring parts with reflectivity from 0.5% to 100% and without changing reference optics. Single cable, power-over-ethernet operation can be combined with high speed innovative software for data acquisition and analysis in a laptop environment for added portability. Acquisition time of 100 µsec enables measurement despite noise and vibration.

NanoCam HD Dynamic Optical Profilers include 4Sight Focus advanced analysis software which reports ISO 25178 surface roughness parameters (S parameters) and provides extensive 2D and 3D analysis options, data filtering, masking and import/export functions.

The compact, lightweight NanoCam HD measurement head measures just 244 mm (9.6″) x 244 mm (9.6″) x 84 mm (3.3″) and weighs 4.5 kg (10 pounds), making it very easy to position. Multiple mounting options include a motorized, joystick controlled tripod, mobile workstation, and interfaces to polishing equipment, gantries or robots.Long working distance interference objectives provide magnifications from 0.9X through 20X, as well as compensated objectives for measuring through glass.

For more information: www.4dtechnology.com


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