Handbook of Optical Metrology 2nd Edition Available

Handbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive overview includes:

  • Fundamentals of light sources, lenses, prisms, and mirrors, as well as opto-electronic sensors, optical devices, and opto-mechanical elements
  • Addresses interferometry, holography, and speckle methods and applications
  • Explains Moiré metrology and the optical heterodyne measurement method
  • Delves into the specifics of diffraction, scattering, polarization, and near-field optics
  • Considers applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes

The Second Edition Handbook of Optical Metrology is fully revised to reflect the latest developments. It also includes four new chapters, comprising almost 100 pages, on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, non-contact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.

The Handbook of Optical Metrology comprises is available on Amazon.

The Handbook of Optical Metrology includes:

Fundamentals of Optical Elements and Devices

Light Sources; Natalia Dushkina

Lenses, Prisms, and Mirrors; Peter R. Hall

Optoelectronic Sensors; Motohiro Suyama

Optical Devices and Optomechanical Elements; Akihiko Chaki and Kenji Magara

Fundamentals of Principles and Techniques for Metrology

Propagation of Light; Natalia Dushkina

Interferometry; David A. Page

Holography; Giancarlo Pedrini

Speckle Methods and Applications; Nandigana Krishna Mohan

Moiré Metrology; Lianhua Jin and Toru Yoshizawa

Optical Heterodyne Measurement Method; Masao Hirano

Diffraction; Toru Yoshizawa

Light Scattering; Lev T. Perelman

Polarization; Michael Shribak

Near-Field Optics; Wenhao Huang, Xi Li, and Guoyong Zhang

Practical Applications

Length and Size; René Schödel

Displacement; Akiko Hirai, Mariko Kajima, and Souichi Telada

Straightness and Alignment; Ruedi Thalmann

Flatness; Toshiyuki Takatsuji and Youichi Bitou

Surface Profilometry; Toru Yoshizawa and Toshitaka Wakayama

Three-Dimensional Shape Measurement; Frank Chen, Gordon M. Brown, and Mumin Song

Fringe Analysis; Jun-ichi Kato

Photogrammetry; Nobuo Kochi

Optical Methods in Solid Mechanics; Anand Asundi

Optical Methods in Flow Measurement; Sang Joon Lee

Polarimetry; Baoliang (Bob) Wang

Birefringence Measurement; Yukitoshi Otani

Ellipsometry; Hiroyuki Fujiwara

Optical Thin Film and Coatings; Cheng-Chung Lee and Shigetaro Ogura

Film Surface and Thickness Profilometry; Katsuichi Kitagawa

Optical Coherence Tomography for Industrial Applications; Tatsuo Shiina

Interference Microscopy for Surface Structure Analysis; Peter J. de Groot

Noncontact Dimensional and Profile Metrology by Video Measurement; Hiroo Tsumuraya and Shuichi Sakai

Optical Metrology in Manufacturing Technology; Rainer Tutsch

On-Machine Measurements; Takashi Nomura and Kazuhide Kamiya