Handbook of Optical Metrology 2nd Edition Available
Handbook of Optical Metrology: Principles and Applications begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive overview includes:
- Fundamentals of light sources, lenses, prisms, and mirrors, as well as opto-electronic sensors, optical devices, and opto-mechanical elements
- Addresses interferometry, holography, and speckle methods and applications
- Explains Moiré metrology and the optical heterodyne measurement method
- Delves into the specifics of diffraction, scattering, polarization, and near-field optics
- Considers applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes
The Second Edition Handbook of Optical Metrology is fully revised to reflect the latest developments. It also includes four new chapters, comprising almost 100 pages, on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, non-contact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.
The Handbook of Optical Metrology comprises is available on Amazon.
The Handbook of Optical Metrology includes:
Fundamentals of Optical Elements and Devices
Light Sources; Natalia Dushkina
Lenses, Prisms, and Mirrors; Peter R. Hall
Optoelectronic Sensors; Motohiro Suyama
Optical Devices and Optomechanical Elements; Akihiko Chaki and Kenji Magara
Fundamentals of Principles and Techniques for Metrology
Propagation of Light; Natalia Dushkina
Interferometry; David A. Page
Holography; Giancarlo Pedrini
Speckle Methods and Applications; Nandigana Krishna Mohan
Moiré Metrology; Lianhua Jin and Toru Yoshizawa
Optical Heterodyne Measurement Method; Masao Hirano
Diffraction; Toru Yoshizawa
Light Scattering; Lev T. Perelman
Polarization; Michael Shribak
Near-Field Optics; Wenhao Huang, Xi Li, and Guoyong Zhang
Practical Applications
Length and Size; René Schödel
Displacement; Akiko Hirai, Mariko Kajima, and Souichi Telada
Straightness and Alignment; Ruedi Thalmann
Flatness; Toshiyuki Takatsuji and Youichi Bitou
Surface Profilometry; Toru Yoshizawa and Toshitaka Wakayama
Three-Dimensional Shape Measurement; Frank Chen, Gordon M. Brown, and Mumin Song
Fringe Analysis; Jun-ichi Kato
Photogrammetry; Nobuo Kochi
Optical Methods in Solid Mechanics; Anand Asundi
Optical Methods in Flow Measurement; Sang Joon Lee
Polarimetry; Baoliang (Bob) Wang
Birefringence Measurement; Yukitoshi Otani
Ellipsometry; Hiroyuki Fujiwara
Optical Thin Film and Coatings; Cheng-Chung Lee and Shigetaro Ogura
Film Surface and Thickness Profilometry; Katsuichi Kitagawa
Optical Coherence Tomography for Industrial Applications; Tatsuo Shiina
Interference Microscopy for Surface Structure Analysis; Peter J. de Groot
Noncontact Dimensional and Profile Metrology by Video Measurement; Hiroo Tsumuraya and Shuichi Sakai
Optical Metrology in Manufacturing Technology; Rainer Tutsch
On-Machine Measurements; Takashi Nomura and Kazuhide Kamiya
