GOM Announces International Student Scanning Competition

For the first time, GOM has organized an international student competition on 3D scanning. The participants’ task is to prepare a lab experiment using GOM’s ATOS 3D scanner. The lab experiments have to be elaborated and submitted in English by June 30, 2017. An international expert jury will evaluate all experiments. The winner or winning team receives the GOM Education Award endowed with EUR 3,000. Furthermore, the winner gets the unique opportunity to present the lab experiment at the GOM 3D Metrology Conference 2017 to industry representatives of renowned companies.

By offering the GOM Education Award, GOM supports practice-oriented education in the field of 3D metrology. Full-field 3D scanning has become established as an industrial standard in reverse engineering and quality assurance. Furthermore, it forms the basis for Industry 4.0, as the complete 3D digitization of parts is a prerequisite for autonomous quality assurance.

In order to support teaching at vocational schools, universities and universities of applied sciences, GOM also developed the educational package “ATOS for Education”. Besides the industrial hardware and powerful software for 3D scanning and inspection, the package also includes elaborated lab experiments as well as lecture material. In addition, GOM offers “ARAMIS for Education” – an educational package for applications in the field of materials and components testing.