X-ray micro-tomography has become an indispensable means for non-invasive, non-destructive characterization of materials in three-dimensions. Industrial computed tomography (CT) scanning, is able to simply and easily characterize material structure of a composite components. CT precisely defines each specimen, in its entirety, down to individual fibers composing the mass. Every structural and dimensional aspect of composite parts can be assessed through a single CT data-set.
In the field of polymers, CT technology is particularly valuable defining material constituents and linking micro-structure with resulting physical properties.
Recent developments facilitate sub-micron resolution in laboratory instruments; CT systems supplier, RX Solutions, work at resolutions as small as 0.3 µm/voxel (resolution measured on microchart JIMA) with an image quality resembling that of Synchrotron acquisitions.
The quality of a high-resolution acquisition depends on several parameters including an understanding of polymer sensitivity to X-radiation, to sufficiently contrast phases, and to acquire appropriate resolution which is defined by requirements of the analysis.
High resolution CT acquisitions require high stability of the X-ray source focal spot but also a high stability of the sample. Lightweight materials can be sensitive to X-radiation and deformation can occur over the course of a scan. RX Solutions software X-Act, for the acquisition and reconstruction of tomographic data, can program timing sequences to control these adverse effects.
High resolution inspection of composite materials is a powerful tool to reveal, in a non-destructive manner, fiber orientation and distribution. After a specimen has been acquired and reconstructed, materials can be segmented by interpreting gray-scale differential. This is related to density change within the composite sample. It’s important to ensure that contrast is sufficient, to separate material constituents, with available 16bits (65,535 values) of information.
In tomography, two things need consideration: sample size and field of view. Both are linked. Sample size plays a role in the quantity of signal transmitted which, in turn, affects image quality. The larger the sample, the longer the scan time to maintain signal/noise ratio. Field of view is dependent on geometric resolution (or voxel size) and therefore, when a sample is larger than the field of view (at high-resolution), the acquisition could be performed on a region of interest (ROI) instead of the overall sample.
RX Solutions CT systems are designed to investigate a variety of parts and materials due to multiple acquisition modes such as “helical” or “stack”. Through innovative design and flexible source/detector positioning, it is possible for RX Solutions systems to increase the field of view, either horizontally or vertically, by moving the detector. Both micro and submicron scale acquisitions can be performed within the same system using automated sample alignment.
RX Solutions CT systems are tomographic solutions that can be used for a variety of 3D applications ranging from research and material sciences to industrial applications in R&D and production. Scalable CT hardware integrated with full featured “X-Act” software, a proprietary offering, streamlines acquisition, reconstruction, and is enhanced by advanced corrective algorithms; capable of automated workflow: scanning, reconstruction, and inspection.
For more information: www.rxsolutions.fr