The new Olympus LEXT OLS5000 3D laser microscope measures surface area roughness precisely and with ease for enhanced productivity, making it suitable for a broad range of applications.
The OLS5000 microscope can be used in research and development and quality inspection in a variety of applications including; semiconductors, electronic components, automotive, medical devices, new material development, nano fabrication, advanced manufacturing and various additional engineering applications.
“The new OLS5000 3D Laser Measuring Microscope delivers high resolution imaging and highly accurate measurement at speeds four times faster than the previous model. Samples that were previously difficult to measure can now be imaged thanks to our expanded range of LEXT dedicated lenses and new range of OLS5000 frames,” said Clare Kelly, Product Manager, Olympus.
To meet this increasing demand, Olympus developed the OLS5000 measuring laser microscope to perform accurate three-dimensional measurement of the surface shape of a wide variety of samples using a technique that is non-contact and non-destructive.
Succeeding the well-established OLS4100 microscope, the OLS5000 offers significantly improved measurement performance. The microscope scans laser light over the surface of a sample to provide enlarged images of micro-scale features and to perform highly accurate measurements of surface area roughness, steps, and other features.
The OLS5000 features new 4K scanning technology and enhanced optics designed to enable the detection of near-perpendicular features and small steps at close to the nanometer scale. The microscope comes with intuitive software designed for usability with features including the ability to automate settings that previously had to be specified by the operator.
“The new software functionality ensures that measurement variability between different users is significantly decreased while maintaining our high level of measurement accuracy and repeatability,” Clare explained.
In addition, large samples or samples with an uneven surface can be measured without preparation, using an expansion frame that can accommodate samples up to 210mm tall and a long working objective lens designed specifically for the OLS5000 microscope. This provides support for sophisticated user requirements from performing observations through data acquisition, analysis and reporting.
For more information: www.olympus-ims.com