Global Technology Awards for YXLON X-ray & CT Metrology System

YXLON International has announced that it has been awarded two prestigious Global Technology Awards in the categories of Metrology and Inspection, X-ray for its Cheetah EVO PLUS X-ray Inspection System and the FF35 CT Metrology System. The awards were presented to the company during a ceremony which took place during the recent SMTA International expo in Chicago.

The Cheetah EVO range of X-ray inspection solutions was created to achieve a simple goal: the very best image in the shortest time, in each of the market sectors. Cheetah EVO systems harness the combined power of several YXLON innovations – FeinFocus X-ray tube technology; high-power target technology; a finely calibrated, long-life flat-panel detector, easy to use software and a state-of-the-art manipulation system. The systems can generate images in extremely high resolution, easily overcoming the unique challenges of the laboratory.

By using slicing technology (Micro3DSlice), the non-destructive inspection of larger areas is possible and substantial cost savings will be achieved, as samples are no longer destroyed by traditional CT or micro-sectioning. Even better, these slice-by-slice images can be analyzed automatically as easily and quickly as a 2D image showing voiding at interfaces perfectly clearly, the key to reliability and failure analysis.

In addition to imaging excellence, with the Cheetah EVO range you can look forward to simple, user-friendly controls and intuitive FGUI – FeinFocus Graphical User Interface – software, not to mention the myriad of benefits of comprehensive automation. One-click solutions make manual inspection effortless and live SMART filters ensure perfect images.

The FF35 CT Metrology is also a market leading X-ray system which takes measurement to another level, providing  precise non-destructive measurements of inner structures with increased complexity via an optimized imaging chain. Each YXLON FF35 CT Metrology system offers: temperature control and compensation, a stable focal spot due to water cooling, accurate sample positioning due to Heidenhain encoders, all of which gives the operator unprecedented levels of measurement accuracy and repeatability.

FURTHER NEWS
Using X-ray Computed Tomography for Dimensional Metrology

The YXLON FF35 CT Metrology enables users to perform actual to nominal comparison of very small features and geometric dimensioning and tolerancing (GD&T). The system is also able to make unstitched images of large assemblies including tablets which can then be viewed at the sub-micron level.

Premiering in 2005, the Global Technology Awards program is an annual celebration of product excellence in electronics surface mount assembly. Premier products based on the finest examples of creative advancement in technology are chosen by a distinguished panel of industry experts.

For more information: www.yxlon.com